What SEMILAB does

SEMILAB Semiconductor Physics Laboratory Co. Ltd. is a privately held, 100% Hungarian-owned metrology equipment manufacturer founded in 1989 as a spin-off from the Research Institute for Technical Physics of the Hungarian Academy of Sciences. The company designs, produces, and sells measurement and characterization equipment used by semiconductor device manufacturers (wafer fabs and IC device makers, including the More-than-Moore segment), photovoltaic/solar cell producers (where it holds market leadership in front-end electrical characterization), and flat panel display manufacturers. Its portfolio spans 45 product lines and 300+ unique products, organized around optical (spectroscopic ellipsometry, photoluminescence imaging, FTIR reflectometry), electrical (DLTS, SPV/FAaST, μ-PCD, JPV, eddy current, CV profiling), and scanning-probe (AFM, nanoindentation) measurement modalities, with capabilities ranging from handheld research instruments to fully automated factory-scale systems.

The company generates revenue primarily through direct equipment sales, supplemented by installation and training services, software licensing tied to hardware ownership, paid measurement services on customer samples, and an 8-year service-and-support guarantee. Pricing is quote-based with a typical 30/60/10 payment schedule (order/shipment/acceptance). SEMILAB goes to market through wholly-owned direct sales and service offices in the USA, Japan, Korea, China, Taiwan, and Singapore, supplemented by regional representatives across 11 additional countries, supported by an in-house workforce of approximately 1,300 people including 200+ physicists, 450+ engineers, and 70+ software developers.

The company's intellectual property base combines organic R&D with a sustained acquisition program (Semitest 2004, Sopra and SSM Inc. 2008, AMS 2009, SDI merger 2009, and Danish DME, Fischer-Cripps, and SemiMap in the 2010s) plus inbound licensing from Applied Materials, IBM, and Sopra. In November 2025, the company divested its U.S. materials analysis business (Semilab USA LLC) to Onto Innovation in a transaction valued at approximately $495–545 million, with the parent entity continuing to operate independently post-divestiture and launching three new product families (COREMA-2000, DLS-1200, LEI) in mid-2026 focused on wide-bandgap and compound semiconductor metrology.

Name

SEMILAB

Legal name

SEMILAB Semiconductor Physics Laboratory Co. Ltd.

Website

https://semilab.com

Company type

Private

Founded year

1989

Operating status

Operating

Headcount range

501–1,000 employees

Short description

SEMILAB is a Hungarian-founded metrology equipment manufacturer serving semiconductor, photovoltaic, and display manufacturers with 45 product lines spanning optical, electrical, and scanning-probe measurement technologies, sold via direct offices in six countries and regional representatives worldwide.

Ownership category

akta.pro rank

Product category

Semiconductor Metrology Equipment

NAICS

Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals (334515), Semiconductor Machinery Manufacturing (333242), Other Measuring and Controlling Device Manufacturing (334519), Analytical Laboratory Instrument Manufacturing (334516)

SIC

Industrial Instruments For Measurement, Display, And Control (3823), Instruments For Meas & Testing Of Electricity & Elec Signals (3825), Optical Instruments & Lenses (3827), Laboratory Analytical Instruments (3826)

akta.pro primary industry

Metrology & Dimensional Measurement (CMMs, laser trackers, gauges, surface/roughness) (IMAGAFAD)

akta.pro secondary industries

Metrology & Scanning Services (Inspection Labs, On-Site Measurement) (IMAAAHAJ), Prototype Metrology, Inspection & Reverse Engineering (Prototype-Focused) (IMAAAFAN)

Keywords

• Semiconductor metrology equipment
• Thin film characterization
• Wafer inspection tools
• Photovoltaic measurement systems
• Spectroscopic ellipsometry

Headquarters

HQ city

Budapest

HQ country

Hungary

HQ region

Europe

Offices8 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Personnel, Technology or R&D, Supply Chain, Operations, Marketing or Sales

Revenue model

1. Metrology Equipment Sales: Sale of measurement and metrology equipment including optical and electrical measurement systems, spectroscopic ellipsometers, AFM systems, and automated manufacturing tools. Equipment ranges from handheld devices to fully automated factory-scale systems.
2. Installation and Training Services: Professional services including equipment installation, setup, testing, operator training, and on-site support.
3. Software Licensing: Software licenses for measurement and analysis systems. Non-exclusive license to use software on one computer connected to the Product. License continues for as long as purchaser owns the hardware system.
4. Measurement Services: Demo measurements and paid measurement services using Semilab metrology systems on customer samples. Reports include measurement principle, system description, results, and suggested configurations.
5. Service and Support: Technical support, spare parts ordering, and maintenance services. 8-year support guarantee for tools in the field after original shipment date.

Pricing tiers

Go-to-market motion1 record

Distribution channels2 records

Marketing channels4 records

Core offering

SEMILAB designs, produces, and sells metrology equipment for the characterization of semiconductor and photovoltaic materials. Its portfolio spans 45 product lines and 300+ unique products, ranging from handheld devices to fully automated factory-scale systems, based on proprietary optical and electrical measurement technologies such as DLTS, SPV, spectroscopic ellipsometry, AFM, JPV, and contactless resistivity mapping. Customers include wafer manufacturers, IC device makers, solar cell producers, display manufacturers, and research institutions.

Product overview

SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers (both inline and R&D), the photovoltaic industry, and the display industry. With 45 product lines and over 300 unique products, its portfolio is organized around optical and electrical measurement technologies. Core product families include: Spectroscopic Ellipsometers (SE-2000, SE-2100, FPT series, R2R SE) for thin film optical characterization; Atomic Force Microscopes (AFM-1000 through AFM-3000) for nanoscale surface and defect analysis; contact/non-contact resistivity and sheet resistance tools (COREMA-2000, CMS/CLS, ACV series, LEI, Eddy Current); contamination monitoring systems (FAaST SPV, PLI, μ-PCD); defect inspection tools (EN-VISION, Light Scattering Tomography); DLTS systems (DLS-1200) for impurity analysis; ion implant monitoring (PMR-C); dielectric characterization (Ellipsometric Porosimetry, Mercury/Elastic Probe CV); epi thickness and resistivity tools (FTIR, Spreading Resistance); and Flat Panel Tester for display manufacturing. The portfolio spans from manual lab tools to fully automated factory-scale systems, serving wafer manufacturers, IC device makers, solar cell, and display manufacturers worldwide.

Differentiator

Problem solved

Functional benefit

Products and services

• Flat Panel Tester (FPT) Advanced measurement tool designed for flat panel display manufacturing environments, offering high-accuracy optical and electrical measurements on large-area substrates integrated into the fab environment.
• Spectroscopic Ellipsometers (SE-2000, SE-1000, SE-2100, INSE-1000, SE-2000-IR, R2R SE) Spectroscopic ellipsometers that determine thin film thickness and optical properties of materials including ITO, OLED, LTPS, IGZO, SiNx, SiOx, and photoresist. SE-2000 and SE-2100 cover Deep UV to Near Infrared, with SE-2100 optimized for the semiconductor industry and R2R SE for roll-to-roll manufacturing.
• Atomic Force Microscopes (AFM-1000 / AFM-2000 / AFM-2100 / AFM-2200 / AFM-3000) Scanning Probe Microscopy (SPM) systems for nanoscale surface characterization, defect characterization, and 3D structure analysis in semiconductor and R&D environments, ranging from lab-use to automated configurations.
• WG-2202 Geometry Inspection Tool Geometry inspection tool for semiconductor wafer metrology, providing non-contact measurement capabilities.
• ACV-2200 / ACV-3000 / ACV-3100 Non-Contact Resistivity Profiling Systems Air-Gap CV Profiling systems for non-contact resistivity measurement and doping profile characterization in semiconductor wafers.
• CMS / CLS Emitter Sheet Resistance Testers Non-contact junction photovoltage (JPV) emitter sheet resistance testers for photovoltaic in-line quality control. CMS models measure wafers on-the-fly without stopping the conveyor belt; CLS models (CLS-1A, CLS-3A, CLS-5A) allow 1–5 point measurement with high throughput for automated cell production lines.
• COREMA-2000 Contactless Resistivity Mapper Next-generation contactless resistivity mapping tool for semi-insulating compound semiconductors such as SiC, GaN, GaAs, CdTe, GaO, and InP. Delivers precise, non-destructive, contactless resistivity measurement for research and industrial semiconductor manufacturing with high accuracy and repeatability.
• DLS-1200 DLTS Metrology System State-of-the-art DLTS (Deep Level Transient Spectroscopy) metrology system for qualitative and quantitative analysis of electrically active impurities and defects in semiconductor materials, now including expanded standard features.
• Semilab LEI Product Family (Non-Contact Mobility and Sheet Resistance) Non-contact mobility and sheet resistance metrology solutions for semiconductor material characterization, enabling resistivity and carrier mobility measurements without physical contact.
• FAaST System (Surface PhotoVoltage — SPV) Flagship digital SPV technology for ultra-low metallic contamination detection in silicon wafers, delivering industry-standard bulk Fe detection for IC fabs.
• Photoluminescence Imaging (PLI) High-throughput full-wafer imaging technique for contamination and defect detection in semiconductor materials.
• µ-PCD (Microwave Photoconductance Decay) Non-contact minority carrier lifetime measurement technique for silicon wafer quality assessment.
• Defect Inspection Tools (EN-VISION, Light Scattering Tomography, Low-Angle Light Scattering Tomography, Polarized IR Imaging) Defect inspection tools using IR light imaging to detect Bulk Micro Defects (BMDs), COPs, dislocations, and oxygen precipitates in semiconductor wafers.
• Ellipsometric Porosimetry (EP) Technique for characterizing porosity of porous dielectric films used in advanced interconnects (ULK/ELK films), measuring pore size, porosity percentage, and mechanical properties.
• FTIR Reflectometry Non-contact optical solution for epi thickness monitoring based on infrared reflection techniques for silicon epi wafer production.
• Air-Gap CV / Mercury CV / Spreading Resistance Profiling Epi resistivity measurement techniques including non-contact Air-Gap CV profiling, Mercury Probe CV profiling, and Spreading Resistance Profiling for doping characterization.
• Elastic Metal Probe CV / Mercury CV Profiling Electrical characterization systems for dielectrics and semiconductor interfaces using Capacitance-Voltage methods to determine dielectric capacitance, charges, interface quality, leakage, and breakdown voltage. Includes non-contact Corona-Kelvin method.
• Photo-Modulated Reflectivity (PMR-C) Ion implant monitoring technique for monitoring dopant concentration and implant dose in silicon and SiC wafers.
• Eddy Current Non-Contact Sheet Resistance Non-contact sheet resistance measurement using eddy current technique for metallization control and implant monitoring on product wafers.
• Surface Acoustic Wave (SAW) Measurement High-end technology for characterizing metal and low-k dielectric layers in semiconductor manufacturing.
• Wafer Sorting and In-Line Photoluminescence Imaging Systems Automated wafer sorters and high-quality in-line photoluminescence imaging for wafer qualification in crystalline silicon solar cell manufacturing.
• Inline Process Control Modules (Sheet Resistance, ARC) In-line modules for sheet resistance measurement and anti-reflective coating (ARC) quality control in photovoltaic production.
• Four-Point Probe and Eddy Current Sensors Thin film measurement sensors for accurate sheet resistance measurement of semiconductor, TCO, and metal layers in photovoltaic thin film production.
• Service Portal Customer-facing web portal powered by Salesforce for service request management, issue reporting, parts replacement ordering, maintenance, and secure invoice delivery and download.
• Installation, Training, and Measurement Services Professional services including equipment installation, setup, testing, operator training, on-site support, demo measurements, and paid measurement services on customer samples, with reports covering measurement principle, system description, results, and suggested configurations.
• Software Licenses for Measurement and Analysis Systems Non-exclusive license to use Semilab software on one computer connected to the product. License continues for as long as the purchaser owns the hardware system.

Quantifiable outcome

• Bulk Fe detection down to 1E8 iron atoms per cubic centimeter
• +2 more outcomes

Segments5 records

Ideal customer profiles5 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Integration2 records

Feature8 records

Partnerships

Seven partnerships are on record, tiered major and core.

• Onto InnovationmajorStrategic or Co-development PartnerOnto Innovation acquired Semilab's materials analysis business for approximately $495-545 million. The acquisition enhances Onto Innovation's product portfolio and expands capabilities in materials characterization for AI-driven advanced packaging applications.
• SopracoreTechnology or IntegrationAcquired by Semilab in 2008, Sopra was producer of the first commercially available spectroscopic ellipsometers in the world. Semilab obtained exclusive license covering the technique of ellipsometry-porosimetry.
• Semitest Inc.coreTechnology or IntegrationAcquired in 2004, bringing technologies for dielectric metrology and epi layer testing.
• SSM Inc. and QC SolutionscoreTechnology or IntegrationJoined Semilab in 2008, delivering contact and non-contact methods for epi layer, dielectric and implant characterization, and high-frequency ac-SPV metrology for epi layers and implants.
• Advanced Metrology Systems (AMS)coreTechnology or IntegrationJoined in 2009, providing high-end technologies such as model-based infrared reflectometry for 3D structure characterization and surface acoustic wave measurements for metal and low-k layers.
• Semiconductor Diagnostics Inc. (SDI)coreTechnology or IntegrationMerged with Semilab, bringing cutting-edge SPV measurements for diffusion length determination and contamination monitoring down to levels as low as 1E8 iron atoms per cubic centimeter, as well as micro-sized corona charging and Kelvin probe for on-product dielectric characterization.
• DME, Fischer-Cripps Laboratories, SemiMapcoreTechnology or IntegrationJoined in 2010s, supplying key metrology solutions like AFM, Nanoindentation and resistivity mapping.

Scale indicators8 records

Recent moves7 records

Expansion highlights5 records

Direct peers

• KLA Corporation: KLA is the global leader in semiconductor process control and yield management, offering broad metrology and inspection portfolios that directly overlap with Semilab's electrical and optical characterization tools across wafer fabs.
• Onto Innovation: Onto Innovation is a direct semiconductor metrology and inspection peer that in late 2025 acquired Semilab's materials analysis business, giving it overlapping product lines in thin film, optical CD, and macro defect inspection.
• Nova Ltd. Nova is a pure-play semiconductor metrology company specializing in optical and X-ray process control solutions, directly competing with Semilab in thin film and CD metrology for advanced nodes.
• Lasertec Corporation: Lasertec is a leading supplier of semiconductor inspection and metrology equipment, particularly for photomask and advanced packaging, with technology portfolios that overlap Semilab's defect inspection and 3D structure characterization offerings.
• Rigaku Corporation: Rigaku is a specialist in X-ray analytical and metrology instruments for semiconductor and materials characterization, overlapping with Semilab's thin film, defect, and materials analysis offerings.

Broad incumbents

• Hitachi High-Tech: Hitachi High-Tech is a broad industrial and electronic equipment conglomerate with a significant semiconductor metrology and inspection division that overlaps with Semilab's electrical CD, defect, and review tools.
• Thermo Fisher Scientific: Thermo Fisher is a large diversified scientific instruments company with analytical and metrology products serving semiconductor, materials, and research labs, broadly overlapping Semilab's R&D-focused measurement portfolio.
• Bruker Corporation: Bruker provides high-performance scientific instruments including X-ray, AFM, and optical metrology systems that overlap with Semilab's materials characterization and nanoscale inspection offerings.
• HORIBA Scientific: HORIBA offers a broad range of analytical and measurement instruments including spectroscopic ellipsometers and Raman systems, directly competing with parts of Semilab's thin film and optical characterization portfolio.
• Carl Zeiss SMT: ZEISS Semiconductor Manufacturing Technology supplies optical and electron-beam metrology and inspection solutions for advanced nodes, directly competing with parts of Semilab's optical metrology and defect inspection portfolio.

Market position

Strengths1 record

Weaknesses1 record

Competitive moat5 records

Key risks6 records

Key highlights7 records

Customer concentration

• YouTubeyoutube.com/@Semilabhu
• Facebookfacebook.com/semilab
• LinkedInlinkedin.com/company/semilab-zrt
• Xx.com/Semilabzrt

Compliance2 records

Revenue estimate

Valuation estimate

Number of profiles

Profiles2 records

Subsidiaries6 records

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about SEMILAB