What Ionoptika does

Ionoptika Ltd is a privately-held UK precision instrumentation company founded in 1994 and headquartered in Chandler's Ford, Hampshire, that designs, manufactures, and sells advanced ion beam systems for scientific research. Its product portfolio is anchored by two instrument platforms — the J Series III time-of-flight Secondary Ion Mass Spectrometer (ToF SIMS, successor to the J105) for high-resolution molecular imaging and surface analysis, and the Q-One single ion implanter for atomic-scale fabrication including quantum device manufacturing — together with a broad range of ion beam sources (C60 cluster, gas cluster, water cluster, liquid metal, and plasma), ultra-high vacuum accessories, and bespoke design services.

The company's underlying technology is differentiated by proprietary continuous DC-mode SIMS operation, RF quadrupole collisional cooling, an asymmetric pulse buncher for high mass resolution, tandem MS capability, and the only commercially available water cluster ion source, which delivers up to 500x greater secondary ion yield than argon for organic species. These capabilities serve materials science, life sciences, surface science, and increasingly quantum science research, with named deployments at the University of Oxford, University of Surrey National Ion Beam Centre, University of Manchester, University of Gothenburg, Pennsylvania State University, the Rosalind Franklin Institute, and the UK's National Physical Laboratory.

Ionoptika's business model is hardware-led: it sells high-value capital equipment through direct enterprise field sales led by a Head of Sales with 17+ years' experience, supplemented by a channel partnership with UCVAC for mainland China and Hong Kong. Revenue also accrues from custom bespoke instrument work, technical support and service contracts, and UHV accessories. The company participates in major SIMS conferences (SIMS-23, SIMS-24) and collaborates closely with UK and European research institutions, including funded consortia such as RADIATE (EU Horizon 2020), Innovate UK quantum manufacturing grants, and the SPARQ(s) project with the University of Surrey, Fraunhofer IAF, and XeedQ.

Name

Ionoptika

Legal name

Ionoptika Ltd

Website

https://ionoptika.com

Company type

Private

Founded year

1994

Operating status

Operating

Headcount range

1–10 employees

Short description

Ionoptika Ltd is a UK precision instrumentation company, founded in 1994, that designs and manufactures ion beam systems — including the J Series III ToF SIMS and Q-One single ion implanter — for academic, government, and industrial research laboratories in materials, life, surface, and quantum science.

Ownership category

akta.pro rank

Product category

Scientific Instrumentation (Ion Beam and Mass Spectrometry)

NAICS

Analytical Laboratory Instrument Manufacturing (334516), Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451)

SIC

Laboratory Analytical Instruments (3826), Industrial Instruments For Measurement, Display, And Control (3823)

akta.pro primary industry

Mass Spectrometry & Spectroscopy Instruments (HLAGAIAB)

akta.pro secondary industries

Ion Implantation & Doping Equipment (HDAHAEAD), Microscopy, Imaging & Flow Cytometry Instruments (HLAGAIAE)

Keywords

• Ion beam instrumentation
• Secondary ion mass spectrometry
• Single ion implantation
• Surface analysis instruments
• Quantum device fabrication

Headquarters

HQ city

Eastleigh

HQ country

United Kingdom

HQ region

Europe

Offices1 record

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Personnel, Operations, Technology or R&D, Supply Chain, Infrastructure, Marketing or Sales

Revenue model

1. Ion Beam Instrumentation Sales: Sale of advanced ion beam instruments including J Series III SIMS, Q-One single ion implanters, and various ion beam sources (C60, Gas Cluster, Liquid Metal, Plasma). Instruments are high-value capital equipment sold to research institutions and laboratories.
2. UHV Accessories: Sale of ultra-high vacuum accessories to enhance precision, sensitivity, and performance in advanced imaging systems.
3. Bespoke/Custom Instrument Design: Custom instrument development and advanced research collaborations worldwide, including bespoke ion beam solutions tailored to specific customer requirements.
4. Technical Support and Service: Customer support including remote diagnostics, instrument maintenance, column alignment, software troubleshooting, and service knowledge base development.

Go-to-market motion3 records

Distribution channels3 records

Marketing channels5 records

Core offering

Ionoptika designs, manufactures, and sells precision ion beam instrumentation — primarily J Series (J105, J Series III) time-of-flight secondary ion mass spectrometry (ToF SIMS) systems and the Q-One single-ion implanter — along with a portfolio of ion beam sources (C60 cluster, gas cluster, liquid metal, plasma), ultra-high vacuum accessories, and bespoke custom instrument design services for advanced research in materials science, life sciences, surface science, and quantum science.

Product overview

Ionoptika is a precision instrumentation company with over 30 years of experience in ion beam technology. The product portfolio centers on two core instrument lines: the J Series (J105 and J Series III) time-of-flight secondary ion mass spectrometry (ToF SIMS) systems for high-resolution molecular imaging and depth profiling, and the Q-One single ion implanter for quantum device fabrication at the atomic level. Supporting these platforms is a comprehensive range of ion beam sources including C60 cluster beams (IOG C60-20, IOG C60-40, C60-20S), gas cluster ion beams (GCIB 10S, GCIB 40, GCIB SM including Water Cluster Source), liquid metal ion guns (IOG 25AU gold, IOG 25GA gallium), and the FLIG 5 floating low-energy beam. The company also offers UHV accessories and bespoke design services. Applications span materials science, life sciences, surface science, and quantum science, utilizing techniques including ToF SIMS, ion implantation, photoelectron spectroscopy, and electron microscopy.

Differentiator

Problem solved

Functional benefit

Products and services

• J Series III Cluster SIMS Advanced time-of-flight secondary ion mass spectrometry (ToF SIMS) instrument for high-resolution mass spectrometry, surface analysis, and depth profiling, serving researchers in materials science, life sciences, surface science, and quantum science. Successor to the J105 with improved capabilities.
• Q-One Single Ion Implanter Innovative single-ion implantation platform for precise fabrication of quantum devices and nanoscale materials engineering, enabling controlled modifications down to the single atom with speeds capable of implanting 1,000 qubits per second.
• J105 SIMS State-of-the-art 3D imaging time-of-flight secondary ion mass spectrometer combining continuous DC-mode operation, RF quadrupole collisional cooling, asymmetric pulse bunching, and integrated tandem MS. Delivers exceptional sensitivity to molecular ions, 3D MS imaging, and consistent performance across samples.
• GCIB 10S Gas Cluster Ion Beam 10 kV high-performance gas cluster ion beam with selectable clusters from Ar1 to greater than Ar3000 and real-time cluster measurement and adjustment, delivering rapid, low-damage sputtering for superior quality surface analysis and ultra-high-resolution depth profile analysis.
• GCIB 40 Gas Cluster Ion Beam 40 kV gas cluster ion beam optimised for organic analysis with increased secondary ion yield, extending the usable mass range for SIMS applications.
• GCIB SM Gas Cluster Ion Beam 70 kV high-performance gas cluster ion beam delivering spot sizes as low as 1.5 micrometres, combining greater spatial resolution with high-sensitivity mass spectrometry.
• IOG C60-40 Carbon Cluster Ion Beam 40 kV carbon-60 cluster ion beam for gentle sputtering and analysis, with spot sizes as low as 300 nm for maximum resolution in 2D and 3D molecular imaging.
• IOG C60-20 Carbon Cluster Ion Beam 20 kV analytical carbon-60 cluster ion beam for molecular analysis applications.
• C60-20S Sputtering Beam Broad-beam sputtering carbon-60 system for high-current, large-area material removal applications.
• IOG 25AU Gold-Cluster Liquid Metal Ion Gun 25 kV gold-cluster liquid metal ion beam system for high-resolution analysis of hard materials.
• IOG 25GA Gallium Liquid Metal Ion Gun 25 kV gallium liquid metal ion beam system for focused ion beam applications.
• FLIG 5 Floating Low Energy Ion Beam Ultra-low energy ion beam system enabling operation down to 200 eV while delivering high current; industry standard for shallow junction depth profiling for nearly two decades.
• UHV Accessories Innovative ultra-high vacuum accessories that enhance precision, sensitivity, and performance in advanced imaging systems.
• Bespoke Instrument Design Service Custom ion beam solutions ranging from bespoke instruments to advanced research collaborations worldwide, tailored to specific customer requirements.

Quantifiable outcome

• Up to 500 times greater secondary ion yield compared to argon using Water Cluster Source
• +4 more outcomes

Named customers8 records

Segments4 records

Ideal customer profiles4 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Feature7 records

Partnerships

Eight partnerships are on record, tiered core, major, primary and historical core.

• University of SurreycoreStrategic or Co-development Partner · 1 April 2023University of Surrey is a key strategic partner in multiple collaborative projects including the SPARQ(s) quantum research project and Innovate UK-funded research into quantum device manufacturing. The partnership involves development of single ion implantation technology and next-generation Water Cluster SIMS instrumentation. Dr. Ella Schneider and Dr. David Cox represent the university in these collaborations.
• Fraunhofer Institute IAFmajorStrategic or Co-development Partner · 1 April 2023Fraunhofer Institute IAF is a key partner in the SPARQ(s) project focused on developing a novel dual source system for the Q-One single ion implantation instrument. The collaboration includes hosting project meetings and clean room facility tours as part of the 2-year collaborative journey.
• XeedQmajorStrategic or Co-development Partner · 1 April 2023XeedQ participates as a partner in the SPARQ(s) project, contributing to the collaborative effort to develop metal and gas ion column technology for quantum applications.
• Rosalind Franklin InstitutecoreStrategic or Co-development Partner · 1 April 2021The Rosalind Franklin Institute, a national institute funded by UK government through UK Research and Innovation, collaborates with Ionoptika on development of stigmatic imaging mass spectrometer technology. The prototype was built at Ionoptika's headquarters and installed at Oxford, with Dr. Felicia Green overseeing the Biological Mass Spectrometry project theme.
• University of OxfordcoreStrategic or Co-development Partner · 1 April 2021University of Oxford collaborated with Ionoptika and Rosalind Franklin Institute on the stigmatic imaging SIMS prototype project. Researchers at Oxford are conducting initial characterization and alignment of the primary ion beam before adding extraction optics and high-speed stigmatic detectors.
• UCVACprimaryChannel Partner/ Reseller/ Distributor · 1 May 2020UCVAC was authorized as Ionoptika's sole agent in mainland China and Hong Kong. With extensive experience in surface science markets, UCVAC assists with business development and provides technical support in the region. The partnership was kickstarted with a joint webinar on the GCIB 10S Gas Cluster Ion Beam.
• RADIATE Consortium PartnersmajorStrategic or Co-development Partner · 1 March 2020Ionoptika joined the RADIATE project with 14 partners from public research institutions and 3 other SMEs. The EU Horizon 2020 funded project aims to strengthen cooperation between European Ion Beam infrastructures, provide transnational access (15,800 hours free), and advance ion beam science and technology. Building on previous SPIRIT project achievements.
• University of Manchesterhistorical coreStrategic or Co-development Partner · 1 January 2002University of Manchester collaborated with Ionoptika in 2002 to produce the first commercial C60 Ion Beam. The partnership established Ionoptika as a pioneer in cluster ion beam technology, with over 150 C60 units sold worldwide since.

Scale indicators5 records

Recent moves6 records

Expansion highlights5 records

Broad incumbents

• Thermo Fisher Scientific: Global life sciences and analytical instrumentation leader whose portfolio includes mass spectrometry, electron microscopy, and now SIMS (via IONTOF acquisition). Provides competitive pressure on Ionoptika across multiple product categories and customer segments.
• Bruker: Large diversified scientific instrumentation company offering a broad mass spectrometry and surface analysis portfolio. Competes with Ionoptika in mass spectrometry imaging and analytical instrumentation across life sciences and materials science applications.
• Carl Zeiss Microscopy: Major electron and ion beam microscopy manufacturer whose Crossbeam FIB-SEM systems compete with Ionoptika's ion beam instrumentation in materials science and nanofabrication applications. Offers broader analytical workflow solutions than Ionoptika's focused portfolio.

Emerging players

• Tescan Orsay Holding: Tescan produces focused ion beam (FIB) and electron microscopy systems with single-ion beam capabilities that overlap with Ionoptika's Q-One ion implantation platform. Their FIB-SEM platforms serve overlapping nanoscale fabrication and analysis markets.
• Raith GmbH: Manufacturer of electron and ion beam nanofabrication and lithography systems. Competes with Ionoptika's Q-One single ion implantation platform in quantum device fabrication and nanoscale patterning applications.

Direct peers

• Hiden Analytical: UK-based manufacturer of mass spectrometry and ion beam instruments for surface analysis, gas analysis, and plasma diagnostics. Overlaps with Ionoptika in advanced ion beam sources and SIMS-adjacent instrumentation, particularly for academic and research customers.
• Physical Electronics (PHI): PHI manufactures surface analysis instruments including SIMS and X-ray photoelectron spectroscopy (XPS) systems. Directly competes with Ionoptika in surface and materials characterization instrumentation for research and industrial customers.
• Cameca (AMETEK): Leading manufacturer of Secondary Ion Mass Spectrometry (SIMS) instruments and atom probe tomography systems, owned by AMETEK. Direct competitor to Ionoptika's SIMS product line serving semiconductor, materials science, and geoscience research markets.
• IONTOF (Thermo Fisher Scientific): IONTOF is a direct competitor in Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) instruments for surface analysis, now operating as part of Thermo Fisher Scientific. They overlap directly with Ionoptika's J105 and J Series III SIMS product lines in academic and industrial materials/life science research markets.

Regional players

• ULVAC: Japanese manufacturer of vacuum and ion beam equipment including ion implantation systems for semiconductor and materials processing. Represents regional (APAC) competition to Ionoptika's Q-One single ion implantation platform in adjacent quantum and semiconductor applications.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat4 records

Key risks6 records

Key highlights7 records

Customer concentration

• LinkedInlinkedin.com/company/ionoptika
• Xx.com/IonoptikaLtd
• Facebookfacebook.com/ionoptika

Revenue estimate

Valuation estimate

Number of profiles

Profiles2 records

Funding overview

Funding rounds1 record

Investors1 record

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Ionoptika