What Dip-View does

Dip-View is a privately held French metrology instrumentation company headquartered in Toulouse, Occitanie, France. The company designs and manufactures 3D optical inspection equipment for critical surface metrology applications including warpage, roughness, and nano-topography measurement across semiconductor, automotive, and optics industrial segments.

Its core product is the D-Surface View system, which uses proprietary High Resolution Deflectometry to capture a full surface measurement of flat surfaces up to 300mm diameter in a single acquisition, extracting parameters such as Bow, Warp, TTv, and LTv from the millimeter to nanometer scale within seconds. A second product, the Vision 300 Ultra Fast Optical Metrology system, is targeted specifically at 12-inch semiconductor wafers with dual-side measurement capability. Supporting features include Fourier-transform-based defect pattern analysis, 2D and 3D roughness/waviness/shape analysis, and open-format data analytics.

Dip-View monetizes through enterprise hardware sales of metrology systems, supplemented by professional services tied to equipment deployment. Distribution is via direct enterprise field sales ([email protected]) and a Global System Partners network spanning Europe, Asia, and the USA. The company is led by a research-grade founding team including President Fernando Moreira, CTO Alexandre Arnoult (PhD Physics/microelectronics, ex-LAAS-CNRS Senior Research Fellow), and R&D Leader Bastien Grimaldi. Dip-View was recognized as a French DEEPTECH company by BPI France in 2023 and holds memberships in the SEMI Organisation and AENEAS.

Name

Dip-View

Legal name

Dip-View

Website

https://dip-view.com

Company type

Private

Operating status

Operating

Headcount range

1–10 employees

Short description

Dip-View is a Toulouse-based French metrology instrumentation company that designs High Resolution Deflectometry-based 3D surface inspection systems (D-Surface View, Vision 300) for semiconductor, automotive, and optics manufacturers.

Ownership category

akta.pro rank

Product category

Semiconductor Metrology Equipment

NAICS

Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451), Other Measuring and Controlling Device Manufacturing (334519)

SIC

Industrial Instruments For Measurement, Display, And Control (3823), Optical Instruments & Lenses (3827)

akta.pro primary industry

Metrology & Inspection Systems (CMM, Laser Trackers, Optical Comparators) (IMAAAHAC)

akta.pro secondary industries

Dimensional Inspection Software (GD&T, SPC, Reporting) (IMAAAHAD), Inspection, Checkweighing & Detection Systems (Vision, Metal, X-ray) (IMALAOAH)

Keywords

• 3D surface metrology
• Optical inspection systems
• Semiconductor metrology equipment
• Warpage measurement instrumentation
• High resolution deflectometry

Headquarters

HQ city

Toulouse

HQ country

France

HQ region

Europe

Offices1 record

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Personnel, Supply Chain, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Metrology Equipment Sales: Sale of high-precision optical metrology equipment including D-Surface View system for analyzing surfaces up to 300mm diameter. Equipment sales likely represent the primary revenue stream for this hardware-focused company.
2. Professional Services: Technical support, training, and potentially installation services associated with metrology equipment deployment and use.

Go-to-market motion2 records

Distribution channels2 records

Marketing channels3 records

Core offering

Dip-View designs, develops, and manufactures 3D optical inspection instrumentation for the metrology of critical surfaces in the semiconductor, automotive, and optics industries. Its flagship product, D-Surface View, applies proprietary High Resolution Deflectometry to measure warpage, bow, and nano-topography on wafers, packages, and optical components. The company recently introduced the Vision 300, an ultra-fast optical metrology tool for 12" wafers.

Product overview

DIP-View offers metrology products centered on High Resolution Deflectometry technology for critical surface inspection. The core product portfolio includes the D-Surface View system for analyzing flat surfaces up to 300mm diameter, the Vision 300 Ultra Fast Optical Metrology for 12-inch wafer inspection, and supporting measurement features for warpage, nano-topography, and data analytics. These products serve semiconductor, automotive, and optics industrial segments.

Differentiator

Problem solved

Functional benefit

Brands

• D-Surface View: Intended to analyze flat surfaces up to 300-mm diameter. Equipment for wafer surface quality control, qualifying surface roughness, shape, flatness, warpage and nano-topography. Other applications include automotive mirrors or optical components.

Products and services

• D-Surface View A 3D optical inspection system based on High Resolution Deflectometry that measures warpage, bow, and nano-topography of critical surfaces including wafers, packages, and optics; intended for semiconductor, automotive, and optics manufacturers.
• Vision 300 Ultra Fast Optical Metrology An ultra-fast optical metrology tool built around High Resolution Deflectometry for the inspection and characterization of 12" wafers; intended for semiconductor fabs and OSATs requiring high-throughput in-line metrology.

Quantifiable outcome

• Full surface measurement in one single acquisition
• +2 more outcomes

Segments3 records

Ideal customer profiles2 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

AI capability4 records

Feature5 records

Partnerships

Three partnerships are on record, tiered minor and core.

• SEMI OrganisationminorStrategic or Co-development PartnerDIP-View joined as a member of the SEMI Organisation to contribute actively to the development of metrology technologies in the Semiconductor market. This membership provides industry influence and networking opportunities within the semiconductor ecosystem.
• AENEASminorStrategic or Co-development PartnerAssociation for European NanoElectronics ActivitieS. DIP-View joined as a member to support access to funding for all types of R&D&I participants in the field of micro and nanoelectronics enabled components and systems.
• BPI FrancecoreOthersBPI France (Banque Publique d'Investissement) has recognized DIP-View as a French DEEPTECH company. This recognition provides access to support from the French innovation organization to grow its business, including potential funding and advisory services.

Scale indicators1 record

Recent moves5 records

Expansion highlights5 records

Broad incumbents

• Keyence Corporation: Keyence offers a broad portfolio of 3D measurement and surface profilometry equipment across industrial inspection and quality control - overlapping with DIP-View in optical and automotive surface inspection use cases.
• Onto Innovation: Onto Innovation (formed via the merger of Nanometrics and Rudolph Technologies) provides optical metrology and inspection for semiconductor wafer and packaging applications, competing for the same wafer warpage and shape measurement budgets as DIP-View.
• Carl Zeiss Industrial Metrology: Carl Zeiss Industrial Metrology provides optical and coordinate measuring systems for high-precision surface and form measurement, addressing the same wafer, optics, and precision component metrology markets as DIP-View.
• Veeco Instruments: Veeco supplies precision surface metrology and inspection equipment for advanced semiconductor and LED manufacturing, overlapping with DIP-View's wafer and substrate metrology use cases.
• KLA Corporation: KLA is the dominant supplier of wafer inspection and metrology tools to the semiconductor industry. While much broader in scope than DIP-View, KLA's wafer inspection portfolio overlaps with the wafer-quality use cases that DIP-View serves.

Direct peers

• CyberOptics Corporation: CyberOptics specializes in optical sensors and 3D surface inspection systems (e.g., MRS technology) for semiconductor and SMT applications - comparable to DIP-View's non-contact 3D wafer inspection offering.
• Polytec GmbH: Polytec manufactures non-contact optical measurement systems, including surface metrology and topography products, used in industrial R&D and production - directly comparable to DIP-View's high-resolution surface inspection offering.
• Sensofar Metroloigies: Sensofar builds optical profilometers (confocal, interferometry, focus variation) for surface roughness, topography, and 3D metrology - overlapping with DIP-View's nano-topography and roughness measurement capabilities in semiconductor and optics applications.
• Bruker (Alicona): Bruker's Alicona division sells optical 3D surface metrology systems based on focus-variation and similar non-contact techniques for roughness, form, and microgeometry measurement - directly comparable in target use cases to DIP-View's D-Surface View.
• Zygo Corporation (AMETEK): Zygo specializes in high-precision optical metrology, interferometry, and surface profiling instruments for surface form, roughness, and thickness measurement - directly addressing wafer and optical component metrology similar to DIP-View's deflectometry-based products.

Market position

Strengths4 records

Weaknesses4 records

Competitive moat2 records

Key risks6 records

Key highlights7 records

Customer concentration

• LinkedInlinkedin.com/company/dip-view

Revenue estimate

Valuation estimate

Number of profiles

Profiles3 records

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Dip-View