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AFM Probes, Tips, and Cantilevers - TipsNano

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uuid0021z23

Namestring
AFM Probes, Tips, and Cantilevers - TipsNano
Legal namestring
Tipsnano OÜ
Websiteurl
tipsnano.com
Company typeenum
Private
Founded yearstring
-
Descriptiontext

Tipsnano OÜ, operating as TipsNano, is a privately held Estonian manufacturer specializing in scanning probe microscopy (SPM) consumables and accessories, headquartered in Tallinn (Kristiina 15-214). The company designs, manufactures, and sells atomic force microscopy (AFM) probes, tips, cantilevers, scanning near-field optical microscopy (SNOM) fiber probes, calibration gratings, HOPG substrates, and TERS silicon probes. Its product portfolio spans six categories — AFM Standard, AFM Special (including patented single crystal diamond probes with sub-10nm tip radius and 10x silicon lifetime), SNOM, HOPG, Calibration, and TERS — covering all major AFM modes (contact, semicontact, noncontact, conductive, magnetic, force modulation, nanoindentation, and lithography). Manufacturing includes clean-room colloidal probe production using a 6-axis micromanipulator and proprietary boron-doped diamond coating processes, with patent protection pending on the DEP_HARD single crystal diamond probe manufacturing method. Calibration gratings are traceable to PTB (Physikalisch-Technische Bundesanstalt).

The company operates a direct-to-customer e-commerce model through its website tipsnano.com, supporting EUR and USD pricing with global shipping from Estonia. It serves three primary segments: research institutions and universities (primary), industrial R&D and manufacturing QC laboratories, and optical microscopy specialists requiring SNOM platforms. Sales channels include self-serve online ordering for standard catalog products and email-based consultation ([email protected]) for custom mixed cantilever sets (MIX_GL/50). B2B checkout requires company name and VAT number, with volume discounts applied through set packages of 5, 10, 15, or 50 units. Pricing ranges from €170 for calibration gratings to €3,500 for SNOM fiber probes, plus a €70 delivery fee; revenue is entirely transactional with no subscription component. SNOM fiber probes are designed for compatibility with NT-MDT NTEGRA and Solver SPM platforms, with integrated quartz tuning forks.

TipsNano appears to be an independently owned, privately held niche specialist with no disclosed funding rounds, parent company, management team, or financial statements. Product launches have been steady but infrequent — new cantilever sets (March 2025), TGL1 calibration grating (August 2023), and PFM_S test sample (April 2022) — suggesting measured product development. The company has filed patent protection for its DEP_HARD diamond probe manufacturing process, indicating investment in IP-based defensibility within the narrow AFM accessory market.

Short descriptiontext

Tipsnano OÜ is a privately held Estonian manufacturer of atomic force microscopy (AFM) probes, tips, cantilevers, and SNOM fiber probes, selling globally via a direct e-commerce platform to research institutions, universities, and industrial R&D laboratories.

Operating statusenum
Operating
Ownership categoryenum
akta.pro rankint
HeadquartersTallinn, Estonia
HQ citystring
Tallinn
HQ countrystring
Estonia
HQ regionstring
Europe
Markets served

Serves global market

Offices1 record

Each record includes

City, Country, Type, Description, Source

Keyword5 values
AFM probes, scanning probe microscopy, cantilever sensors, SNOM fiber probes, calibration gratings
Industry2 codes
1Metrology, Inspection & Process Control Equipment
CodeHDAHAEAHPrimaryYes
2MEMS Actuators & Micro-Mechanisms (Micromirrors/Microfluidics)
CodeHDAHALAJPrimaryNo
NAICS code5 codes
  • Other Measuring and Controlling Device Manufacturing334519
  • Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals334515
  • Analytical Laboratory Instrument Manufacturing334516
  • Research and Development in Nanotechnology541713
  • Navigational, Measuring, Electromedical, and Control Instruments Manufacturing33451
SIC code3 codes
  • Laboratory Analytical Instruments3826
  • Industrial Instruments For Measurement, Display, And Control3823
  • Optical Instruments & Lenses3827
Product category
Scientific Instrumentation Consumables (AFM/SPM Probes)
No data
GTM motion2 records

Each record includes

Type, Description, Source

Revenue model4 records
1AFM Probes and Cantilevers Sales
TypeHardware Sales
Description

Primary revenue from selling AFM probes, tips, and cantilevers. Products sold in configured sets (5, 10, 15, 50 units) with per-set pricing. Single-crystal diamond probes command premium pricing (€790-€2,250). Standard silicon cantilevers range from €170-€1,200. Transaction-based one-time purchases with no recurring subscription component.

tipsnano.com
2Custom Mixed Cantilever Sets
TypeHardware Sales
Description

Personal Mixed Cantilever Sets (MIX_GL/50) configured per customer specifications. Customers select probes from predefined list including various coatings (Au, Pt, PtIr). Requires email consultation or form submission. Higher average order value through customization.

3SNOM Fiber Probes
TypeHardware Sales
Description

Specialized scanning near-field optical microscopy fiber probes. Sold in sets of 10 with premium pricing (€2,100-€3,500). Compatible with NT-MDT systems and other SPM platforms. Includes probes with and without tuning forks.

tipsnano.com
4Calibration Standards and Test Samples
TypeHardware Sales
Description

Calibration gratings (TGZ1, TGZ2, TGG1, TGQ1) and test samples (PFM_S) for SPM calibration and verification. Essential consumables for research labs maintaining AFM equipment. Prices range €170-€380 per unit.

tipsnano.com
Marketing channels4 records

Each record includes

Title, Type, Stage, Description, Source

Distribution channels2 records

Each record includes

Title, Type, Scope, Target buyer, Description, Source

Cost components6 values
Supply Chain, Operations, Technology or R&D, Personnel, Marketing or Sales, Infrastructure
Pricing details7 tiers
1Single Crystal Diamond Probes - Premium wear-resistant probes
ModelUnit PricingBilling cadencePay-as-you-go
Notes

DEP01 €900/5 probes, DEP01_SS €1,350/5 probes, DEP30R €900/5 probes, DEP30R_SS €1,350/5 probes, DEP_HARD €2,250/5 probes, DRP_In €790/5 probes, DRPS_In €1,350/5 probes. Diamond probes offer 10x lifetime vs silicon with typical tip radius 7nm.

tipsnano.com
2Calibration Gratings - SPM calibration standards
ModelUnit PricingBilling cadencePay-as-you-go
Notes

TGZ2 €170, TGG1 €200, TGQ1 €380. Step heights from 20nm to 110nm for X/Y/Z calibration.

tipsnano.com
3High Accuracy Standard Cantilevers - HA series
ModelUnit PricingBilling cadencePay-as-you-go
Notes

HA_NC/15 €390, HA_NC/50 €1,050. Two-cantilever chips with Au reflective coating, tip radius <10nm, resonant frequency 235kHz/140kHz.

tipsnano.com
4W2C+ Conductive Coating Cantilevers - Electrical AFM modes
ModelUnit PricingBilling cadencePay-as-you-go
Notes

HA_HR/W2C/15 €490, HA_HR/W2C/50 €1,200. Oxidation-resistant W2C+ coating for long-time electrical mode operation. Includes 15 or 50 cantilevers per package.

tipsnano.com
5SNOM Fiber Probes - Near-field optical microscopy
ModelUnit PricingBilling cadencePay-as-you-go
Notes

MF112_NTF/10 €3,500 (NT-MDT compatible), MF113_NTF/10 €3,500, MF002/10 €2,100, MF003/10 €2,100. Sets of 10 probes with aperture 100-125nm, wavelength 450-770nm.

tipsnano.com
6Colloidal Probes - Spherical particle AFM tips
ModelUnit PricingBilling cadencePay-as-you-go
Notes

CPC, CPN, CPFM all priced at €890/5 probes. SiO2 spheres available in 5 sizes: 2μm, 3.5μm, 6.5μm, 10μm, 15μm. For contact, noncontact/semicontact, and force modulation modes.

tipsnano.com
7Custom Mixed Cantilever Sets - Configured per customer needs
ModelUnit PricingBilling cadencePay-as-you-go
Notes

MIX_GL/50 €1,280 for 50 GOLDEN series probes configured to customer specifications. UNISET/50 $1,598.50 (50 probes for multiple modes). UNISET/25 $862.50 (25 probes).

tipsnano.com
GTM typeB2B
B2B
Offering typeHardware or Manufacturing
Hardware or Manufacturing
Core offering1 text field

TipsNano manufactures and sells Atomic Force Microscopy (AFM) probes, tips, and cantilevers, along with SNOM fiber probes, HOPG substrates, calibration gratings, and TERS probes for scanning probe microscopy (SPM) applications. Products are sold in pre-configured sets of 5, 10, 15, or 50 units covering all major AFM modes (contact, semicontact, noncontact, conductive, magnetic, force modulation), with custom mixed cantilever sets configured per customer specifications.

Differentiator
Functional benefit
Problem solved
Quantifiable outcome1 of 3 values shown
  • Single crystal diamond tips maintain sharpness for entire working day and beyond, vs typical silicon probe degradation
+2 more records
Product overview1 text field

TipsNano is a specialized supplier of accessories for scanning probe microscopes (SPM), offering a comprehensive portfolio of AFM cantilevers, probes, tips, and calibration standards. The product portfolio is organized into five main categories: AFM Standard cantilevers (NSG, HA, CSG, FMG series) for general microscopy; AFM Special products including super sharp variants, high aspect ratio whisker tips, and diamond-coated probes; Single Crystal Diamond probes (DEP, DRP series) providing 10x longer lifetime than silicon with sub-10nm resolution; SNOM fiber probes for near-field optical microscopy; and Calibration standards (gratings, HOPG, test samples) for instrument calibration. The products integrate as a complete AFM workflow solution, from specialized imaging probes to metrology validation tools.

Product and service12 records
1Single Crystal Diamond Probes
CategoryAFM Probes - Premium Specialty
Description

Premium AFM probes with single crystal diamond tips (DEP, DRP series) offering high durability (10x silicon lifetime), typical tip radius 2-25nm, and applications for topography and electrical measurements. Targets AFM researchers requiring wear-resistant probes for extended imaging and industrial R&D users.

2Colloidal Probes
CategoryAFM Probes - Specialty
Description

Colloidal AFM probes with micron-scale SiO2 spheres attached to tipless cantilevers, including CPC (Contact mode), CPN (Noncontact/Semicontact), and CPFM (Force Modulation) series. Used for surface force measurement, adhesion forces, and cell mechanics studies.

3SNOM Fiber Probes
CategorySNOM Probes
Description

Scanning Near-Field Optical Microscopy fiber probes with apertures 100-125nm, operating wavelengths 450-770nm, and compatibility with NT-MDT systems including optional quartz tuning-fork integration. For near-field optical microscopy and SNOM imaging applications.

4Calibration Gratings
CategoryCalibration Standards
Description

Precision SPM calibration standards including TGT1 (tip shape estimation), TGG1 (X/Y axis calibration), TGQ1 (3D calibration, 20nm step), TGZ2 (Z-axis calibration, 110nm step), and TGL1 (multiparameter calibration with multiple periods and structures).

5Test Samples
CategoryCalibration Standards
Description

Reference samples including PFM_S for Piezoresponse Force Microscopy calibration using piezoelectric single crystal lead PMN-PT.

6HOPG Reference Materials
CategoryReference Materials
Description

Highly Oriented Pyrolytic Graphite samples for STM/AFM applications available in ZYB, ZYH, and ZYA quality grades, including monochromator variants for calibration purposes.

7TERS Silicon Probes
CategoryAFM Probes - Specialty
Description

Tip-Enhanced Raman Spectroscopy silicon probes for combined AFM-Raman measurements.

8Cantilever Sets
CategoryAFM Consumables Bundles
Description

Pre-configured cantilever packages including SS_FD_SET (super sharp + diamond tips), MSSET/30 (mixed modes), UNISET (comprehensive mode coverage), and MIX_GL/50 (customizable golden series) for various AFM applications.

9AFM Standard Cantilevers
CategoryAFM Probes - Standard
Description

Standard AFM cantilevers including NSG30, NSG10, NSG_L, HA_NC series for semicontact/noncontact AFM modes with resonant frequencies ranging from 125-235 kHz and force constants from 3.5-100 N/m.

10AFM Special Cantilevers
CategoryAFM Probes - Specialty
Description

Specialized AFM cantilevers including super sharp (CSG10_SS, FMG01_SS), high aspect ratio (NSC05), diamond coated (DCP30), and top visual (VIT_P) variants for specialized imaging applications.

11Conductive AFM Cantilevers
CategoryAFM Probes - Conductive
Description

Conductive AFM cantilevers with various tip coatings including PtIr (CSG10/Pt, FMG01/Pt, NSG30/Pt), Au (CSG01/Au, NSG01/Au), and W2C+ (HA_FM/W2C+, HA_HR/W2C+) for electrical AFM modes including SKM, SCM, SRIM, EFM, and LAO Lithography.

12Magnetic AFM Cantilevers
CategoryAFM Probes - Magnetic
Description

High resolution long lifetime magnetic probes including MFM01 and MFM_LM series for magnetic force microscopy. MFM_LM features resonant frequency 45-115kHz and force constant 2.8-9.5N/m for low coercive magnetic samples.

Scale indicator3 records

Each record includes

Type, Value, Description, Source

Recent move5 records

Each record includes

Date, Type, Title, Description, Source

Expansion highlight5 records

Each record includes

Type, Description

Peers10 records
TypeDirect peer
Description

Long-established German/Swiss AFM probe specialist (PointProbe, SuperSharp-Silicon series); directly competes in standard and super-sharp silicon cantilever categories.

TypeRegional player
Description

Distributor and reseller of multiple AFM probe lines (including some TipsNano competitors) primarily serving European and North American research markets; adjacent competitor via catalog distribution.

TypeDirect peer
Description

US-based AFM probe manufacturer (Applied NanoStructures) offering silicon, conductive, and specialized probes; competes for the same academic and industrial AFM customers.

TypeDirect peer
Description

Swiss manufacturer of AFM probes (including the well-known NCH and PPP series); directly comparable as a specialty probe-only supplier serving the same academic and industrial research customers.

TypeDirect peer
Description

Major AFM/SPM instrument maker that also sells its own probes (including SNOM fiber probes); TipsNano already has a product-compatibility relationship with NT-MDT NTEGRA/Solver platforms, making it both partner and competitor.

TypeEmerging player
Description

Small US specialist in functionalized and customized AFM/SECM probes; competes in the specialized, low-volume segment where TipsNano's custom MIX_GL sets and conductive coatings also play.

TypeBroad incumbent
Description

Oxford Instruments' AFM brand sells proprietary probes alongside its Cypher and MFP-3D instruments; competes for high-end probe demand as part of a wider AFM instrumentation portfolio.

TypeDirect peer
Description

Legacy MikroMasch brand continues to supply silicon AFM probes (Hi'Res, HQ:NSC, etc.) globally; directly comparable product offering across standard and specialized silicon probes.

TypeDirect peer
Description

Bulgarian AFM probe manufacturer offering low-cost silicon cantilevers, frequently used by academic labs; competes on price in the standard-probe segment where TipsNano's diamond and specialty SKUs differentiate.

TypeDirect peer
Description

Largest global AFM probe manufacturer (legacy MikroMasch/Veeco). Directly competes with TipsNano across the full AFM cantilever/probe catalog and benefits from captive demand via Bruker's own AFM instruments.

Market position
Strengths4 records

Each record includes

Headline, Details, Source

Weaknesses4 records

Each record includes

Headline, Details, Source

Competitive moat5 records

Each record includes

Type, Details

Key risks5 records

Each record includes

Headline, Details, Source

Key highlights6 records

Each record includes

Headline, Details, Source

Customer concentration

Classification, Details

Segment3 records

Each record includes

Title, Type, Primary, Description, Pain point addressed, Use case, Source

Ideal customer profile3 records

Each record includes

Profile, Firmographic size, Sales motion, Sales cycle length, Buying structure, Purchase trigger, Buyer persona, Geography, Industry vertical, Primary use case, Description, Pain points, Evidence proof points, Target buyer

Technology focused
Yes
API detail
Has APIbool
No

Docs URL, Description

AI maturity
App detail

Has app

Feature5 records

Each record includes

Title, Differentiator, Description, Source

Core technology
Revenue estimate
Valuation estimate
Number of profiles
No data
No data
Funding overview

Funding stage, Last funding date, Total funding USD

Funding rounds

Each record includes

Round, Amount USD, Date, Pre money valuation, Total investors, Investors, News

Investors

Each record includes

Name, Type, Date of entry, Rounds participated, Website

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Each record includes

Name, Acquisition type, Announced date, Completed date, Status, Website, News

Investment

Each record includes

Name, Round, Announced date, Lead investor, Website, News

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

AFM Probes, Tips, and Cantilevers - TipsNano

Scientific Instrumentation Consumables (AFM/SPM Probes)tipsnano.com

Tipsnano OÜ is a privately held Estonian manufacturer of atomic force microscopy (AFM) probes, tips, cantilevers, and SNOM fiber probes, selling globally via a direct e-commerce platform to research institutions, universities, and industrial R&D laboratories.

What AFM Probes, Tips, and Cantilevers - TipsNano does

Tipsnano OÜ, operating as TipsNano, is a privately held Estonian manufacturer specializing in scanning probe microscopy (SPM) consumables and accessories, headquartered in Tallinn (Kristiina 15-214). The company designs, manufactures, and sells atomic force microscopy (AFM) probes, tips, cantilevers, scanning near-field optical microscopy (SNOM) fiber probes, calibration gratings, HOPG substrates, and TERS silicon probes. Its product portfolio spans six categories — AFM Standard, AFM Special (including patented single crystal diamond probes with sub-10nm tip radius and 10x silicon lifetime), SNOM, HOPG, Calibration, and TERS — covering all major AFM modes (contact, semicontact, noncontact, conductive, magnetic, force modulation, nanoindentation, and lithography). Manufacturing includes clean-room colloidal probe production using a 6-axis micromanipulator and proprietary boron-doped diamond coating processes, with patent protection pending on the DEP_HARD single crystal diamond probe manufacturing method. Calibration gratings are traceable to PTB (Physikalisch-Technische Bundesanstalt).

The company operates a direct-to-customer e-commerce model through its website tipsnano.com, supporting EUR and USD pricing with global shipping from Estonia. It serves three primary segments: research institutions and universities (primary), industrial R&D and manufacturing QC laboratories, and optical microscopy specialists requiring SNOM platforms. Sales channels include self-serve online ordering for standard catalog products and email-based consultation ([email protected]) for custom mixed cantilever sets (MIX_GL/50). B2B checkout requires company name and VAT number, with volume discounts applied through set packages of 5, 10, 15, or 50 units. Pricing ranges from €170 for calibration gratings to €3,500 for SNOM fiber probes, plus a €70 delivery fee; revenue is entirely transactional with no subscription component. SNOM fiber probes are designed for compatibility with NT-MDT NTEGRA and Solver SPM platforms, with integrated quartz tuning forks.

TipsNano appears to be an independently owned, privately held niche specialist with no disclosed funding rounds, parent company, management team, or financial statements. Product launches have been steady but infrequent — new cantilever sets (March 2025), TGL1 calibration grating (August 2023), and PFM_S test sample (April 2022) — suggesting measured product development. The company has filed patent protection for its DEP_HARD diamond probe manufacturing process, indicating investment in IP-based defensibility within the narrow AFM accessory market.

AFM Probes, Tips, and Cantilevers - TipsNano firmographics

Firmographics
Name
AFM Probes, Tips, and Cantilevers - TipsNano
Legal name
Tipsnano OÜ
Website
https://tipsnano.com
Company type
Private
Operating status
Operating
Short description
Tipsnano OÜ is a privately held Estonian manufacturer of atomic force microscopy (AFM) probes, tips, cantilevers, and SNOM fiber probes, selling globally via a direct e-commerce platform to research institutions, universities, and industrial R&D laboratories.
Ownership category
akta.pro rank

AFM Probes, Tips, and Cantilevers - TipsNano industry classification

Industry
Product category
Scientific Instrumentation Consumables (AFM/SPM Probes)
NAICS
Other Measuring and Controlling Device Manufacturing (334519), Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals (334515), Analytical Laboratory Instrument Manufacturing (334516), Research and Development in Nanotechnology (541713), Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451)
SIC
Laboratory Analytical Instruments (3826), Industrial Instruments For Measurement, Display, And Control (3823), Optical Instruments & Lenses (3827)
akta.pro primary industry
Metrology, Inspection & Process Control Equipment (HDAHAEAH)
akta.pro secondary industry
MEMS Actuators & Micro-Mechanisms (Micromirrors/Microfluidics) (HDAHALAJ)

Keywords

  • AFM probes
  • Scanning probe microscopy
  • Cantilever sensors
  • SNOM fiber probes
  • Calibration gratings

Where AFM Probes, Tips, and Cantilevers - TipsNano is headquartered

Location

Headquarters

HQ city
Tallinn
HQ country
Estonia
HQ region
Europe

Offices1 record

Markets served

AFM Probes, Tips, and Cantilevers - TipsNano business model

Business model
GTM type
B2B
Offering type
Hardware or Manufacturing
Cost components
Supply Chain, Operations, Technology or R&D, Personnel, Marketing or Sales, Infrastructure

Revenue model

  1. AFM Probes and Cantilevers Sales: Primary revenue from selling AFM probes, tips, and cantilevers. Products sold in configured sets (5, 10, 15, 50 units) with per-set pricing. Single-crystal diamond probes command premium pricing (€790-€2,250). Standard silicon cantilevers range from €170-€1,200. Transaction-based one-time purchases with no recurring subscription component.
  2. Custom Mixed Cantilever Sets: Personal Mixed Cantilever Sets (MIX_GL/50) configured per customer specifications. Customers select probes from predefined list including various coatings (Au, Pt, PtIr). Requires email consultation or form submission. Higher average order value through customization.
  3. SNOM Fiber Probes: Specialized scanning near-field optical microscopy fiber probes. Sold in sets of 10 with premium pricing (€2,100-€3,500). Compatible with NT-MDT systems and other SPM platforms. Includes probes with and without tuning forks.
  4. Calibration Standards and Test Samples: Calibration gratings (TGZ1, TGZ2, TGG1, TGQ1) and test samples (PFM_S) for SPM calibration and verification. Essential consumables for research labs maintaining AFM equipment. Prices range €170-€380 per unit.

Pricing tiers

ModelBillingPrice
Unit PricingPay-as-you-goSingle Crystal Diamond Probes - Premium wear-resistant probes
Unit PricingPay-as-you-goCalibration Gratings - SPM calibration standards
Unit PricingPay-as-you-goHigh Accuracy Standard Cantilevers - HA series
Unit PricingPay-as-you-goW2C+ Conductive Coating Cantilevers - Electrical AFM modes
Unit PricingPay-as-you-goSNOM Fiber Probes - Near-field optical microscopy
Unit PricingPay-as-you-goColloidal Probes - Spherical particle AFM tips
Unit PricingPay-as-you-goCustom Mixed Cantilever Sets - Configured per customer needs

Go-to-market motion2 records

Distribution channels2 records

Marketing channels4 records

AFM Probes, Tips, and Cantilevers - TipsNano product offering

Product offering

Core offering

TipsNano manufactures and sells Atomic Force Microscopy (AFM) probes, tips, and cantilevers, along with SNOM fiber probes, HOPG substrates, calibration gratings, and TERS probes for scanning probe microscopy (SPM) applications. Products are sold in pre-configured sets of 5, 10, 15, or 50 units covering all major AFM modes (contact, semicontact, noncontact, conductive, magnetic, force modulation), with custom mixed cantilever sets configured per customer specifications.

Product overview

TipsNano is a specialized supplier of accessories for scanning probe microscopes (SPM), offering a comprehensive portfolio of AFM cantilevers, probes, tips, and calibration standards. The product portfolio is organized into five main categories: AFM Standard cantilevers (NSG, HA, CSG, FMG series) for general microscopy; AFM Special products including super sharp variants, high aspect ratio whisker tips, and diamond-coated probes; Single Crystal Diamond probes (DEP, DRP series) providing 10x longer lifetime than silicon with sub-10nm resolution; SNOM fiber probes for near-field optical microscopy; and Calibration standards (gratings, HOPG, test samples) for instrument calibration. The products integrate as a complete AFM workflow solution, from specialized imaging probes to metrology validation tools.

Differentiator

Problem solved

Functional benefit

Products and services

  • Single Crystal Diamond Probes Premium AFM probes with single crystal diamond tips (DEP, DRP series) offering high durability (10x silicon lifetime), typical tip radius 2-25nm, and applications for topography and electrical measurements. Targets AFM researchers requiring wear-resistant probes for extended imaging and industrial R&D users.
  • Colloidal Probes Colloidal AFM probes with micron-scale SiO2 spheres attached to tipless cantilevers, including CPC (Contact mode), CPN (Noncontact/Semicontact), and CPFM (Force Modulation) series. Used for surface force measurement, adhesion forces, and cell mechanics studies.
  • SNOM Fiber Probes Scanning Near-Field Optical Microscopy fiber probes with apertures 100-125nm, operating wavelengths 450-770nm, and compatibility with NT-MDT systems including optional quartz tuning-fork integration. For near-field optical microscopy and SNOM imaging applications.
  • Calibration Gratings Precision SPM calibration standards including TGT1 (tip shape estimation), TGG1 (X/Y axis calibration), TGQ1 (3D calibration, 20nm step), TGZ2 (Z-axis calibration, 110nm step), and TGL1 (multiparameter calibration with multiple periods and structures).
  • Test Samples Reference samples including PFM_S for Piezoresponse Force Microscopy calibration using piezoelectric single crystal lead PMN-PT.
  • HOPG Reference Materials Highly Oriented Pyrolytic Graphite samples for STM/AFM applications available in ZYB, ZYH, and ZYA quality grades, including monochromator variants for calibration purposes.
  • TERS Silicon Probes Tip-Enhanced Raman Spectroscopy silicon probes for combined AFM-Raman measurements.
  • Cantilever Sets Pre-configured cantilever packages including SS_FD_SET (super sharp + diamond tips), MSSET/30 (mixed modes), UNISET (comprehensive mode coverage), and MIX_GL/50 (customizable golden series) for various AFM applications.
  • AFM Standard Cantilevers Standard AFM cantilevers including NSG30, NSG10, NSG_L, HA_NC series for semicontact/noncontact AFM modes with resonant frequencies ranging from 125-235 kHz and force constants from 3.5-100 N/m.
  • AFM Special Cantilevers Specialized AFM cantilevers including super sharp (CSG10_SS, FMG01_SS), high aspect ratio (NSC05), diamond coated (DCP30), and top visual (VIT_P) variants for specialized imaging applications.
  • Conductive AFM Cantilevers Conductive AFM cantilevers with various tip coatings including PtIr (CSG10/Pt, FMG01/Pt, NSG30/Pt), Au (CSG01/Au, NSG01/Au), and W2C+ (HA_FM/W2C+, HA_HR/W2C+) for electrical AFM modes including SKM, SCM, SRIM, EFM, and LAO Lithography.
  • Magnetic AFM Cantilevers High resolution long lifetime magnetic probes including MFM01 and MFM_LM series for magnetic force microscopy. MFM_LM features resonant frequency 45-115kHz and force constant 2.8-9.5N/m for low coercive magnetic samples.

Quantifiable outcome

  • Single crystal diamond tips maintain sharpness for entire working day and beyond, vs typical silicon probe degradation
  • +2 more outcomes

Companies that use AFM Probes, Tips, and Cantilevers - TipsNano

Customer profile

Segments3 records

Ideal customer profiles3 records

AFM Probes, Tips, and Cantilevers - TipsNano technology and API

Technology

Technology focussed Yes

API detail

Has API
No
API docs
API detail

Core technology

AI maturity

App detail

Feature5 records

AFM Probes, Tips, and Cantilevers - TipsNano partnerships and signals

Strategic signal

Scale indicators3 records

Recent moves5 records

Expansion highlights5 records

AFM Probes, Tips, and Cantilevers - TipsNano competitors and assessment

Company assessment

Direct peers

  • Nanosensors (now NanoWorld Group): Long-established German/Swiss AFM probe specialist (PointProbe, SuperSharp-Silicon series); directly competes in standard and super-sharp silicon cantilever categories.
  • AppNano: US-based AFM probe manufacturer (Applied NanoStructures) offering silicon, conductive, and specialized probes; competes for the same academic and industrial AFM customers.
  • NanoWorld (Neuchâtel): Swiss manufacturer of AFM probes (including the well-known NCH and PPP series); directly comparable as a specialty probe-only supplier serving the same academic and industrial research customers.
  • NT-MDT: Major AFM/SPM instrument maker that also sells its own probes (including SNOM fiber probes); TipsNano already has a product-compatibility relationship with NT-MDT NTEGRA/Solver platforms, making it both partner and competitor.
  • Mikromasch (standalone USA presence): Legacy MikroMasch brand continues to supply silicon AFM probes (Hi'Res, HQ:NSC, etc.) globally; directly comparable product offering across standard and specialized silicon probes.
  • BudgetSensors: Bulgarian AFM probe manufacturer offering low-cost silicon cantilevers, frequently used by academic labs; competes on price in the standard-probe segment where TipsNano's diamond and specialty SKUs differentiate.
  • Bruker AFM Probes: Largest global AFM probe manufacturer (legacy MikroMasch/Veeco). Directly competes with TipsNano across the full AFM cantilever/probe catalog and benefits from captive demand via Bruker's own AFM instruments.

Regional players

  • Ted Pella / NanoAndMore: Distributor and reseller of multiple AFM probe lines (including some TipsNano competitors) primarily serving European and North American research markets; adjacent competitor via catalog distribution.

Emerging players

  • Rocky Mountain Nanotechnology: Small US specialist in functionalized and customized AFM/SECM probes; competes in the specialized, low-volume segment where TipsNano's custom MIX_GL sets and conductive coatings also play.

Broad incumbents

Market position

Strengths4 records

Weaknesses4 records

Competitive moat5 records

Key risks5 records

Key highlights6 records

Customer concentration

AFM Probes, Tips, and Cantilevers - TipsNano financial estimates

Financial estimate

Revenue estimate

Valuation estimate

AFM Probes, Tips, and Cantilevers - TipsNano leadership team

Management profile

Number of profiles

AFM Probes, Tips, and Cantilevers - TipsNano funding detail

Funding detail

Funding overview

Funding rounds

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AFM Probes, Tips, and Cantilevers - TipsNano M&A and investment

M&A and investment

M&A

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Frequently asked questions about AFM Probes, Tips, and Cantilevers - TipsNano

What does AFM Probes, Tips, and Cantilevers - TipsNano do?

TipsNano manufactures and sells Atomic Force Microscopy (AFM) probes, tips, and cantilevers, along with SNOM fiber probes, HOPG substrates, calibration gratings, and TERS probes for scanning probe microscopy (SPM) applications. Products are sold in pre-configured sets of 5, 10, 15, or 50 units covering all major AFM modes (contact, semicontact, noncontact, conductive, magnetic, force modulation), with custom mixed cantilever sets configured per customer specifications.

Is AFM Probes, Tips, and Cantilevers - TipsNano a public or private company?

AFM Probes, Tips, and Cantilevers - TipsNano is a private company. It is classified as founder individual operated bootstrapped and is currently operating.

When was AFM Probes, Tips, and Cantilevers - TipsNano founded?

AFM Probes, Tips, and Cantilevers - TipsNano was founded in -1.

Where is AFM Probes, Tips, and Cantilevers - TipsNano based?

AFM Probes, Tips, and Cantilevers - TipsNano is headquartered in Tallinn, Estonia, in the Europe region.

How does AFM Probes, Tips, and Cantilevers - TipsNano make money?

Four revenue lines are on record. AFM Probes and Cantilevers Sales are the primary driver. The others are custom Mixed Cantilever Sets, SNOM Fiber Probes and calibration Standards and Test Samples.

Who are AFM Probes, Tips, and Cantilevers - TipsNano's main competitors?

Direct peers on record are Nanosensors (now NanoWorld Group), AppNano, NanoWorld (Neuchâtel), NT-MDT, Mikromasch (standalone USA presence), BudgetSensors and Bruker AFM Probes. Ted Pella / NanoAndMore is listed as a regional player. Rocky Mountain Nanotechnology is listed as an emerging player. Asylum Research (Oxford Instruments) — probes is listed as a broad incumbent.

Does AFM Probes, Tips, and Cantilevers - TipsNano have an API?

No public API is recorded for AFM Probes, Tips, and Cantilevers - TipsNano.

What industry is AFM Probes, Tips, and Cantilevers - TipsNano in?

AFM Probes, Tips, and Cantilevers - TipsNano's product category is Scientific Instrumentation Consumables (AFM/SPM Probes). Its primary akta.pro industry code is HDAHAEAH, Metrology, Inspection & Process Control Equipment, with a secondary code of HDAHALAJ, MEMS Actuators & Micro-Mechanisms (Micromirrors/Microfluidics). Its NAICS code is 334519 and its SIC code is 3826.

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