Name

Funa Scientific Instruments (Shanghai) Co

Legal name

复纳科学仪器（上海）有限公司

Website

https://phenom-china.com

Company type

Private

Founded year

2012

Operating status

Operating

Headcount range

51–100 employees

Ownership category

akta.pro rank

Product category

Scientific Instruments

NAICS

Analytical Laboratory Instrument Manufacturing (334516), Other Measuring and Controlling Device Manufacturing (334519), Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables (334513)

SIC

Laboratory Analytical Instruments (3826)

akta.pro primary industry

Microscopy, Imaging & Flow Cytometry Instruments (HLAGAIAE)

akta.pro secondary industry

Metrology, Inspection & Machine Tool Accessories (CMMs, Probing, Gauging) (IMAHADAK)

Keywords

• Desktop scanning electron microscopy
• Electron microscopy instruments
• Scientific imaging equipment
• Particle analysis systems
• Materials characterization instruments

Headquarters

HQ city

Minhang

HQ country

China

HQ region

Asia

Offices4 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Supply Chain, Personnel, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Hardware Sales - Desktop SEM Systems: Sale of desktop scanning electron microscopes including Phenom Pharos G2 (field emission), Phenom XL G3, Phenom ProX G7, Phenom Pro G7, Phenom Pure G7, Nano G2, ParticleX series, STEM variants, and domestic models. Each unit is sold as a capital equipment purchase with varying configurations and accessories.
2. Accessories, Consumables and Software Licenses: Sale of sample cups, EDS detectors, AFM attachments, ion milling accessories, expansion software (PhenomMAPS, ChemiSEM, ChemiPhase, Avizo Trueput), and peripheral hardware (原位样品杆, stretch stages, vacuum transfer holders). Software licenses for automated analysis tools.
3. Product Leasing and Rental: Equipment leasing services for Phenom desktop SEMs, allowing customers to rent equipment on a periodic basis rather than purchase outright. Includes paid testing services where customers can access SEM capabilities without owning equipment.
4. Training and Technical Support Services: User training programs from basic SEM theory to Level 5 application engineer certification, provided in Shanghai, Beijing, Guangzhou, and Chengdu. Technical support and after-sales services are offered as ongoing engagement.

Pricing tiers

Go-to-market motion1 record

Distribution channels3 records

Marketing channels8 records

Core offering

Funa Scientific Instruments (Shanghai) Co., Ltd. (Phenom Scientific / 飞纳电镜) sells, distributes, and supports Phenom desktop scanning electron microscopes (SEM) and complementary scientific instruments for the Chinese market. Its core offering is the Phenom desktop SEM product family — covering field-emission models (Pharos G2, Nano G2, Pharos-STEM), CeB6 filament models (ProX G7, Pro G7, Pure G7), the large-chamber automated XL G3, and the glovebox-compatible Ar-C — along with a broad portfolio of automated particle analysis systems (ParticleX Battery, ParticleX Steel, Particle AC, DiatomAI, GSR), desktop micro/nano CT (NEOSCAN N60-NXL), ion-milling sample prep (Technoorg Linda), in-situ TEM holders (DENSsolutions), AFMs (icspi), atomic layer deposition (Forge Nano), nanoparticle tools (VSParticle), and visual particle detection (Fastmicro). Customers are universities, research institutes, and industrial enterprises requiring high-resolution materials characterization, cleanliness/QC analysis, and failure diagnostics.

Product overview

Funa Scientific Instruments (Shanghai) Co operates as Phenom Scientific, offering a comprehensive portfolio of desktop scanning electron microscopes and related scientific instruments. The core product line centers on Phenom desktop SEM systems including Pharos G2 (field emission, 1.5nm resolution), Nano G2 (field emission, 2.5nm), XL G3 (large chamber, 8nm), ProX G7 (with integrated EDS), Pro G7 and Pure G7 (CeB6 filament models). Supporting product categories include: ParticleX series for automated cleanliness analysis (Battery for lithium batteries, AC for automotive, Steel for steel inclusions, DiatomAI for diatom detection, GSR for gunshot residue); Technoorg Linda ion milling equipment for sample preparation; NEOSCAN desktop micro/nano CT systems (N60/N70/N80/N90/NXL); DENSsolutions in-situ TEM holders (Wildfire, Lightning, Climate∞, Stream∞, Arctic); icspi atomic force microscopes; Forge Nano PALD systems (Prometheus, Pandora); VSParticle nanoparticle generators and printers; and Fastmicro visualization particle detection systems (SAS, PFS, PDS, MicroQuick). The product architecture combines hardware instruments with intelligent software including PhenomMAPS (large-area image stitching), ChemiSEM (color imaging), ChemiPhase (phase analysis), and Avizo Trueput (battery QA/QC), enabling multi-modal analysis workflows from materials science to life sciences applications.

Differentiator

Problem solved

Functional benefit

Brands

• Phenom SEM: Desktop scanning electron microscope product line including Phenom Pharos, Phenom XL, Phenom ProX, Phenom Pro, Phenom Pure, and Nano G2 models
• ParticleX
• PhenomMAPS
• ChemiSEM
• NEOSCAN
• DENSsolutions
• Technoorg Linda
• icspi
• Fastmicro
• VSParticle
• Forge Nano

Products and services

• Phenom Pharos G2 Desktop Field Emission SEM High-resolution desktop field-emission scanning electron microscope using a Schottky field-emission electron source, achieving 1.5nm resolution and 2,000,000× magnification with integrated shock and magnetic resistance; designed for universities, research institutes, and industrial laboratories needing field-emission performance in a benchtop footprint.
• Phenom Nano G2 Desktop Field Emission SEM Desktop field-emission SEM with 2.5nm resolution and 1,000,000× magnification, integrating backscattered electron, secondary electron, and EDS energy-spectrum imaging; for materials characterization and failure analysis in research and industrial labs.
• Phenom XL G3 Large Chamber Automated Desktop SEM Large-chamber automated desktop SEM accommodating samples up to 100×100mm with 8nm resolution, 36-sample capacity, and Industrial 4.0 automation with AI intelligent scanning; intended for high-throughput automated production-line QC and R&D.
• Phenom ProX G7 SEM-EDS Integrated System Desktop SEM with integrated EDS providing 350,000× magnification, 6nm resolution, and seventh-generation CeB6 filament technology with 3,000-hour lifespan; combines high-resolution imaging and elemental analysis in one instrument for materials analysis.
• Phenom Pro G7 High-Resolution Professional Desktop SEM High-resolution professional desktop SEM with 350,000× magnification, 6nm resolution, customizable detectors, and extended research capabilities; for advanced academic and industrial research applications.
• Phenom Pure G7 Cost-Effective Standard Desktop SEM Cost-effective standard desktop SEM with 175,000× magnification and 10nm resolution, providing essential high-resolution imaging; for budget-conscious academic and industrial users needing reliable SEM imaging.
• Phenom Pharos-STEM Desktop Field Emission SEM-STEM Desktop field-emission SEM-STEM combining field-emission-gun brightness with transmission-mode imaging at 1nm resolution using BF, DF, and HAADF detectors; designed for unstained biological samples and advanced materials research, including a dedicated biological STEM model (Pharos STEM).
• Phenom Ar-C Argon-Glovebox-Compatible Desktop SEM Desktop SEM designed exclusively for installation and operation inside argon gloveboxes, with a vacuum-transfer sample holder that enables direct study of air-sensitive samples (e.g., lithium battery materials) without atmospheric exposure.
• Domestic Phenom Desktop SEM (Thermo Fisher Guangzhou) Domestic Chinese-market Phenom SEM model manufactured by Thermo Fisher Scientific's Guangzhou facility, retaining original Phenom resolution and performance with a Chinese-language interface; supports localized supply and pricing for the Chinese market.
• ParticleX Battery Lithium Cleanliness Analysis System Fully automated SEM+EDS system for identification, analysis, and statistical classification of Cu, Zn, Fe, and ferromagnetic metal contaminants in lithium battery production; used by lithium battery manufacturers such as CATL for production-line cleanliness control.
• Particle AC Automated Automotive Cleanliness Analysis System Automated SEM+EDS system compliant with VDA19/ISO16232 standards for identifying particle types and pollution sources in automotive component cleanliness testing; serves automotive OEMs and parts suppliers.
• ParticleX Steel Non-Metallic Inclusion Analysis System Fully automated SEM-based non-metallic inclusion analysis system for steel cleanliness and quality control, providing comprehensive steel sample analysis and reporting; used by steel manufacturers and metallurgical labs.
• ParticleX Automated Particle Analysis System Industrial-grade fully automated SEM+EDS particle analysis and process-control system providing automated recognition, classification, and one-click reporting for general cleanliness QC applications.
• DiatomAI Automated Diatom Detection System Fully automated AI-based diatom detection system built on Phenom desktop SEM technology, identifying and classifying diatom species for forensic drowning-case analysis and environmental monitoring.
• GSR Gunshot Residue Analysis System Desktop SEM-based automated gunshot residue (GSR) analysis system that identifies and classifies particle evidence for forensic investigations and public-security casework.
• AFM-SEM Atomic Force and Scanning Electron Microscope Integrated System Combined AFM-SEM system that integrates atomic force microscopy into Phenom XL SEM via a sample-cup swap, enabling multi-modal correlation analysis of morphology, elements, mechanical, electrical, and magnetic properties at the same location under the same conditions.
• LiteScope AFM-SEM Synchronization Technology AFM-SEM synchronization technology (LiteScope / NenoVision) compatible with major SEM brands including Thermo Fisher, TESCAN, Zeiss, Hitachi, and JEOL, offering C-AFM, KPFM, MFM, PFM, STM modes and nanoindentation for multi-modal analysis.
• PhenomMAPS Large-Area Image Stitching Software Multi-modal, multi-dimensional map-style automatic image acquisition and stitching software enabling large-area automated EDS data collection and cross-platform data correlation with optical, Raman, IR, XPS, and CAD inputs.
• ChemiSEM Color Elemental Imaging Technology Technology combining SEM morphology with EDS composition analysis in real time, generating colorized element distribution maps overlaid on SEM images with quantitative results.
• ChemiPhase Unbiased Phase Analysis System Unbiased phase identification system that automatically identifies individual phases from all spectral results without element predefinition, avoiding peak overlap and blind spots in phase analysis.
• Avizo Trueput Battery Quality Assurance Software Battery quality assurance and quality-control automation software for QA/QC processes in battery manufacturing and R&D workflows.
• Technoorg Linda Ion Beam Sample Preparation Systems Ion beam technology product line from Technoorg Linda including SEMPREP SMART ion milling, UniMill ion thinning, Gentle Mill precision ion polishing, and GIB precision ion beam systems for high-quality SEM and TEM sample preparation.
• NEOSCAN Desktop Micro/Nano CT Systems (N60/N70/N80/N90/NXL) Desktop high-resolution micro-CT and nano-CT product line from NEOSCAN including N60, N70, N80, N90 (40nm ultra-high resolution desktop nano CT), and NXL (large-chamber model for large-size, high-density objects up to 32×54cm).
• DENSsolutions In-Situ TEM Sample Holders In-situ TEM sample holders from DENSsolutions including Wildfire (in-situ heating), Lightning (in-situ thermoelectric), Climate∞ (in-situ gas-phase heating and electrical), Stream∞ (in-situ liquid-phase heating and electrical), and Arctic (in-situ cryogenic thermoelectric) for advanced sample characterization.
• icspi Fully Automated Desktop Atomic Force Microscope Fully automated desktop atomic force microscope from icspi achieving nanoscale imaging; integrates with Phenom SEM for multi-modal AFM-SEM analysis.
• icspi Portable Atomic Force Microscope Portable atomic force microscope from icspi achieving 3D nanoscale images in 3 clicks; used for on-site and field nanoscale imaging applications.
• Forge Nano Particle Atomic Layer Deposition (PALD) Systems Particle atomic layer deposition systems from Forge Nano including Prometheus fluidized-bed ALD and Pandora multi-function ALD, enabling precise nano-coating of powder and planar samples.
• VSParticle Nanoparticle Generation and Printing Systems Nanoparticle generation, printing, and deposition systems from VSParticle including VSP-P1 nanoparticle printing deposition, VSP-G1 nanoparticle generator producing pure metal/metal-oxide/alloy aerosol, and VSP-S1 nanoparticle size-selection and deposition system.
• Fastmicro Visual Particle Detection Systems Visual particle detection systems from Fastmicro including SAS surface particle analyzer, PFS environmental dust real-time monitor, PDS wafer and protective-film particle rapid detection systems, and MicroQuick ultra-fast automotive-part cleanliness particle scanner.
• Equipment Leasing and Paid Testing Services Equipment leasing services that allow customers to rent Phenom desktop SEMs on a periodic basis, plus paid testing services at the four-city test-center network that enable customers without equipment ownership to access SEM capabilities.
• SEM Training and Technical Support Services User training programs spanning basic SEM theory through Level 5 application engineer certification, delivered at test centers in Shanghai, Beijing, Guangzhou, and Chengdu, plus ongoing technical support and after-sales services.

Quantifiable outcome

• Phenom XL G3 achieves 40-second average imaging time, 5x faster than competing desktop SEMs
• +3 more outcomes

Named customers1 record

Segments4 records

Ideal customer profiles4 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

AI capability7 records

Feature12 records

Partnerships

Ten partnerships are on record, tiered notable, core and secondary.

• Sioux Group (荷兰Sioux集团)notableStrategic or Co-development PartnerPhenom Scientific collaborates with the Dutch Sioux Group (an ASML supplier) to co-develop solutions for desktop SEM technology. Sioux contributed to the development and industrialization of Phenom's products.
• Thermo Fisher Scientific - Guangzhou (赛默飞世尔（广州）生物科技有限公司)coreOEM/ Whitelabel/ Licensing PartnerDomestic Chinese-market Phenom SEM models are manufactured by Thermo Fisher Scientific's Guangzhou facility (located at 康兆二路 77号, Building B3 & B4) as a dedicated R&D and manufacturing base. These domestic models retain the same resolution and performance as imported Phenom products.
• DENSsolutionscoreTechnology or IntegrationDENSsolutions provides in-situ TEM sample holders (Wildfire, Lightning, Climate∞, Stream∞, Arctic) for use with Phenom SEM systems, enabling原位加热、电、冷冻、热电、气相、液相等 sample characterization.
• Technoorg LindacoreTechnology or IntegrationTechnoorg Linda provides ion beam technologies including SEMPREP SMART ion milling, UniMill ion thinning, Gentle Mill precision ion polishing, and GIB precision ion beam systems for high-quality SEM sample preparation.
• NEOSCANsecondaryTechnology or IntegrationNEOSCAN provides desktop high-resolution micro-CT systems (N60, N70, N80, N90, NXL) distributed through Phenom Scientific China's product portfolio.
• Forge NanosecondaryTechnology or IntegrationForge Nano provides Particle Atomic Layer Deposition (PALD) systems including Prometheus fluidized bed ALD and Pandora multi-function ALD for precise nano-coating of powder and planar samples.
• VSParticlesecondaryTechnology or IntegrationVSParticle provides nanoparticle generation and printing systems (VSP-P1, VSP-G1, VSP-S1) for nanoparticle preparation and deposition, enabling complete nanoparticle research workflows.
• FastmicrosecondaryTechnology or IntegrationFastmicro provides visual particle detection solutions including the SAS surface particle analyzer, PFS environmental dust monitoring, PDS wafer and protective film particle detection systems, and MicroQuick automotive cleanliness ultra-fast particle scanner.
• icspicoreTechnology or Integrationicspi provides atomic force microscope (AFM) products including fully automated desktop AFM and portable AFM, integrated with Phenom SEM through the AFM-SEM 一体机 product.
• LiteScope / NenoVisioncoreTechnology or IntegrationLiteScope provides AFM-SEM fusion technology compatible with major SEM brands including Thermo Fisher, TESCAN, ZEISS, Hitachi, and JEOL, enabling multi-modal correlation analysis. LiteScope offers various AFM modes (C-AFM, KPFM, MFM, PFM, STM) and nanoindentation modules.

Scale indicators8 records

Recent moves6 records

Expansion highlights6 records

Broad incumbents

• Keyence: Japanese digital microscopy and factory automation leader. Comparable in addressing production-line QC use cases with optical/digital microscopy, though it does not currently produce SEMs — relevant for adjacent industrial microscopy competition.
• JEOL: Japanese electron microscopy and analytical instrument manufacturer with TEM/SEM products. Comparable in targeting materials science and life sciences research customers; serves similar academic and industrial Chinese accounts.
• Rigaku: Japanese X-ray analytical instruments manufacturer offering XRF, XRD, and micro-CT. Comparable through micro-CT and elemental analysis products (XRF is similar to EDS in use case) targeting materials characterization customers.
• Thermo Fisher Scientific: Global scientific instruments giant with the most comprehensive electron microscopy portfolio (including Quanta, Apreo, Helios). Direct strategic partner via Guangzhou manufacturing of domestic Phenom models; competes head-on in Chinese research and industrial markets.
• Bruker: US analytical instruments company with strong presence in micro-CT (SkyScan), EDS, and X-ray analysis. Comparable through micro-CT, EDS, and battery/materials QC product portfolio targeting similar customers.
• Oxford Instruments: UK-based scientific instruments company with SEM accessories, EDS detectors (Ultim Max), and in-situ TEM/SEM holders. Comparable through the DENSsolutions-style in-situ holder portfolio and EDS integration products it sells in China.
• ZEISS (Carl Zeiss Microscopy): German microscopy incumbent with strong SEM, STEM, and X-ray microscopy lines targeting academic and industrial customers. Competes with Phenom in both floor-standing and emerging desktop SEM categories.
• Hitachi High-Tech: Japanese electron microscopy and analytical instruments business with FE-SEM, TEM, and AFM products. Competes in Chinese industrial QC and academic markets; comparable in targeting battery/automotive cleanliness applications.

Direct peers

• TESCAN Group: Czech electron microscopy specialist offering SEM, FIB-SEM, and micro-CT products. Comparable in product mix (electron microscopes + micro-CT), mid-size private-market positioning, and multi-segment industrial/academic target market.

Regional players

• Leica Microsystems (Danaher): German microscopy brand owned by Danaher, specializing in optical and electron microscopy sample preparation. Comparable as a sample-prep and microscopy instrumentation specialist serving similar life-sciences and materials customers in China via its own distribution.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat5 records

Key risks6 records

Key highlights7 records

Customer concentration

• LinkedInlinkedin.com/company/phenom-china-

Revenue estimate

Valuation estimate

Number of profiles

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Funa Scientific Instruments (Shanghai) Co