Name

大塚电子(苏州)有限公司 / Otsuka Electronics (Suzhou) Co., Ltd.

Legal name

大塚电子（苏州）有限公司

Website

https://otsukael.com.cn

Company type

Private

Founded year

2007

Operating status

Operating

Headcount range

1–10 employees

Ownership category

akta.pro rank

Product category

Optical Measurement and Analysis Instruments

NAICS

Analytical Laboratory Instrument Manufacturing (334516), Other Measuring and Controlling Device Manufacturing (334519), Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables (334513), Semiconductor Machinery Manufacturing (333242)

SIC

Laboratory Analytical Instruments (3826), Industrial Instruments For Measurement, Display, And Control (3823), Optical Instruments & Lenses (3827), Instruments For Meas & Testing Of Electricity & Elec Signals (3825)

akta.pro primary industry

Mass Spectrometry & Spectroscopy Instruments (HLAGAIAB)

akta.pro secondary industries

Industrial-Grade Sensors & Transducer Components (Discrete sensing elements, transducers, MEMS sensors) (IMAGAJAO), Machine Vision & Optical Sensing (Cameras, 3D vision, LiDAR, illumination) (IMAGAFAB), Sensors, MEMS & Imaging ICs (HDAHAAAG)

Keywords

• Optical measurement instruments
• Spectral interferometry
• Film thickness measurement
• Particle size analysis
• Zeta potential analysis

Headquarters

HQ city

Suzhou

HQ country

China

HQ region

Asia

Offices2 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Supply Chain, Technology or R&D, Personnel, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Optical Measurement and Analysis Equipment Sales: The company generates revenue primarily from selling precision optical measurement and analysis instruments, including spectral spectrometers, film thickness meters, particle size/zeta potential analyzers, and related systems. Revenue is generated through direct sales to enterprise customers in semiconductor, display, LED, healthcare, and materials industries.
2. After-Sales Service and Maintenance: The company provides paid after-sales services including repair, calibration, parts/consumables, and periodic maintenance inspections. Local repair services are available at the Suzhou office, with options for on-site repair or return-to-service.

Go-to-market motion2 records

Distribution channels1 record

Marketing channels5 records

Core offering

Otsuka Electronics (Suzhou) imports and sells Japanese-manufactured precision optical measurement and analysis instruments in China. Its portfolio includes particle size and zeta potential analyzers (ELSZ series, nanoSAQLA), spectroscopic film thickness meters (SF-3, OPTM, FE series, embedded and line-scan systems), phase difference meters and ellipsometers, multi-channel spectrometers (MCPD-9800/6800), LED and lighting photometric systems (LE, HS-1000, GP, HM/FM), quantum efficiency systems (QE-2100/5000), the MINUK 3D optical wave field microscope, and the ASA-1000 absolute screen calibrator. The instruments serve enterprise customers in semiconductor, flat panel display, LED, automotive, functional film, and bio-pharmaceutical industries.

Product overview

Otsuka Electronics (Suzhou) Co., Ltd. offers a comprehensive portfolio of optical measurement and analysis instruments based on proprietary 'light' technology. The product line is organized into three main categories: Analysis Instruments (ELSZ series for zeta potential, particle size, and molecular weight measurement including ELSZneo, ELSZneoSE, ELSZ-2000ZS, and nanoSAQLA systems); Measurement Instruments (spanning film thickness/thickness evaluation including SF-3 spectroscopic interferometric wafer thickness meter, OPTM microscopic spectroscopic film thickness meter, Smart handheld thickness meter, FE series ellipsometers, line-scan film thickness meters, embedded thickness detectors, and thickness mapping systems; functional material evaluation including PP-1000 small-angle laser scatterometer, RE-200 and RETS series phase difference meters, and MINUK 3D optical wave field microscope; semiconductor evaluation instruments; FPD-related evaluation devices including LCF series color filter measurement and RETS cell gap measurement; light source/lighting evaluation including MCPD multi-channel spectrometers, HS-1000 spectral radiance meters, GP series angular distribution measurement, HM/FM total luminous flux systems, QE series quantum efficiency measurement, LE series LED analyzers, and ASA-1000 screen calibrator; and fluorescence evaluation instruments). The core technology platform centers on spectroscopic interferometry, photon correlation spectroscopy, and polarization optics, with the MCPD series spectrometer serving as the foundational technology across multiple product lines.

Differentiator

Problem solved

Functional benefit

Products and services

• ZETA电位·粒径·分子量测试系统 ELSZneo Flagship zeta potential, particle size, and molecular weight analyzer for dilute to concentrated solutions. Features multi-angle detection, particle concentration measurement, and microrheology analysis. Used in R&D and quality control of bio-pharmaceutical, cosmetics, ink, and abrasive materials.
• ZETA电位·粒径测试系统 ELSZneoSE Specialized zeta potential and particle size measurement system with selectable functions based on user requirements, for bio-pharmaceutical, cosmetics and materials customers.
• ZETA电位·粒径·分子量测试系统 ELSZ-2000ZS High-sensitivity zeta potential, particle size, and molecular weight measurement system with APD detector and temperature gradient analysis for material characterization.
• 多样品纳米粒子径测试系统 nanoSAQLA Multi-sample nanoparticle size analyzer based on dynamic light scattering (DLS) capable of measuring 5 samples continuously in approximately 1 minute each.
• 分光干涉式晶圆膜厚仪 SF-3 Spectroscopic interferometric wafer film thickness meter for real-time monitoring of wafer substrate thickness during grinding and glass substrate thinning processes. Used by semiconductor manufacturers.
• 显微分光膜厚仪 OPTM series Microscopic spectroscopic film thickness meter for absolute reflectance measurement, analyzing film thickness, refractive index n, and extinction coefficient k with non-contact, non-destructive testing in under 1 second per point. Used in semiconductor and display applications.
• Smart 膜厚仪 Handheld portable film thickness meter based on reflective spectroscopy (optical interferometry), enabling on-site non-destructive 3D-sample measurement with 0.1μm precision.
• 膜厚量测仪 FE-300 Cost-effective optical film thickness meter supporting thin to thick films with UV-NIR spectral analysis, used in production and quality control lines.
• 嵌入式膜厚检测仪 Embedded film thickness detector using spectroscopic interferometry with FFT film thickness analysis (Patent 4834847), suitable for integration into OEM manufacturing equipment.
• 线扫描膜厚仪【在线型】 Online line-scan film thickness meter using line-scan method for full-width film detection at high speed, supporting widths up to 10 meters.
• 线扫描膜厚仪【离线型】 Offline line-scan film thickness meter for high-speed, high-precision detection of film thickness uniformity in offline QA environments.
• 光波动场三次元显微镜 MINUK Proprietary 3D optical wave field microscope enabling non-destructive, non-contact visualization of nanoscale transparent samples and defects without physical focusing.
• 相位差测量装置 RETS-100nx Phase difference measurement device using polarization optics and a multi-channel spectroscopic detector for measuring retardance, slow axis, RTH, and 3D refractive index.
• 椭偏仪 FE-5000 Ellipsometer for measuring elliptic parameters in the UV-Vis region (250-800 nm) and analyzing nano-scale multi-layer thin films using variable reflection angle measurement.
• 小角激光散射仪 PP-1000 Small-angle laser scattering instrument using SALS for polymer material and film evaluation, analyzing spherulite radius and polymer mixing correlation distance.
• 高速相位差测量装置 RE-200 High-speed phase difference measurement device capable of measuring low residual phase difference from 0nm with processing time under 0.1 seconds.
• MCPD series 在线评估测试系统 Online film evaluation system based on MCPD spectroscopic interferometry for high-speed film thickness, concentration, and color measurement from 65 nm to 92 μm.
• 多通道光谱仪 MCPD-9800 / 6800 Multi-channel spectrometer series for spectral measurement across UV-Vis-NIR with 512/1024-channel detectors, 5μs minimum exposure time, and USB/LAN connectivity.
• 液晶层间隙量测设备 RETS series Liquid crystal cell gap measurement system for display inspection measuring cell gap, twist angle, rubbing angle, pretilt angle, and phase difference.
• 彩色滤光片/彩色光刻胶测量装置 LCF series Color filter and color photoresist measurement system supporting transmission spectrum, color measurement, concentration, film thickness, and reflection spectrum analysis.
• 膜厚测量系统 FE-3700/5700 Film thickness measurement system for high-speed, high-precision measurement of various films on glass substrates for LCD, TFT, and OLED applications.
• 高灵敏度光谱仪 HS-1000 High-sensitivity spectrometer for measuring ultra-low brightness (0.005 cd/m²) to high brightness (400,000 cd/m²) across 355 nm to 835 nm.
• 总光通量测量系统 HM/FM series Total spectral luminous flux measurement system for LED lighting up to 2400mm straight tubes, compliant with IESNA LM-79 and LM-80 standards.
• 分光配光测量系统 GP series Spectral angular distribution measurement system for LED lighting fixtures up to 2400mm with automatic 2-axis goniometer control and IESNA LM-75 compatibility.
• 高速LED光学特性仪 LE series High-speed LED optical characteristics analyzer with 2ms minimum spectral measurement for production-line integration, supporting tristimulus values and chromaticity coordinates.
• 量子效率测量系统 QE-2100 Quantum efficiency measurement system for absolute quantum yield measurement with integrated hemisphere, removing re-excitation fluorescence emission.
• 高灵敏度近红外量子效率测量系统 QE-5000 High-sensitivity near-infrared quantum efficiency measurement system capable of measuring singlet oxygen quantum yield as low as 0.01% with direct 1270 nm spectral observation.
• ASA-1000 绝对屏幕校准仪 Absolute screen calibrator for automotive headlamp photometric adjustment and verification, supporting near/far light calibration with multi-algorithm compliance to global photometric standards.
• nanoSAQLA AS50 多样品纳米粒径测量系统（带自动取样器） nanoSAQLA with AS50 auto-sampler, supporting up to 50 consecutive samples with minimum 0.4 mL sample capacity per run.
• After-Sales Service, Repair, Calibration and Maintenance Paid after-sales services including repair, calibration, parts and consumables, and periodic maintenance inspections, provided locally at the Suzhou service center with on-site repair or return-to-service options.

Quantifiable outcome

• Film thickness measurement resolution down to 1nm (OPTM series)
• +4 more outcomes

Named customers5 records

Segments5 records

Ideal customer profiles6 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Feature6 records

Scale indicators3 records

Recent moves7 records

Expansion highlights5 records

Broad incumbents

• Shimadzu: Shimadzu produces a broad portfolio of analytical and measuring instruments, including spectrophotometers and film thickness systems, with overlap to Otsuka's spectrophotometer and spectroscopic measurement offerings in Asian markets.
• Hitachi High-Tech: Hitachi High-Tech manufactures semiconductor metrology and inspection equipment as well as analytical instruments, overlapping with Otsuka's wafer film thickness (SF-3 series) and semiconductor process measurement offerings.
• Hamamatsu Photonics: Hamamatsu manufactures photonic sensors, spectrometers, and optical measurement devices. Its multi-channel detectors and spectroscopy modules overlap with the underlying technology of Otsuka's MCPD series spectrometers and spectral instruments.
• KLA Corporation: KLA dominates semiconductor process control and optical/film metrology at leading-edge fabs, including wafer inspection and film thickness measurement — overlapping with Otsuka's SF-3, OPTM, and embedded metrology tools for semiconductor customers.
• Bruker: Bruker manufactures high-end analytical instruments including X-ray, optical, and spectroscopic tools that overlap with Otsuka's material and thin-film characterization instruments across semiconductor and life-science customers.

Direct peers

• Renishaw: Renishaw produces optical and laser-based metrology systems used in semiconductor and precision manufacturing — comparable to Otsuka's line-scan film thickness and interferometric measurement instruments for industrial customers.
• JASCO: JASCO is a Japanese manufacturer of spectroscopes, ellipsometers, and optical measurement instruments directly comparable to Otsuka's MCPD spectrometers, ellipsometers, and phase difference measurement systems.
• HORIBA Scientific: HORIBA's Scientific segment manufactures spectroscopy, particle characterization (zeta potential, particle size), and fluorescence instruments — directly overlapping Otsuka's ELSZ series and MCPD spectrometer product lines for similar industrial and life-science customers.
• Malvern Panalytical: Malvern Panalytical makes particle size, zeta potential, and molecular weight analyzers using dynamic and electrophoretic light scattering, directly competing with Otsuka's ELSZ and nanoSAQLA nanoparticle characterization product lines.

Emerging players

• Accurion: Accurion specializes in imaging ellipsometry and thin-film metrology, an emerging niche adjacent to Otsuka's ellipsometer and film thickness product lines targeting semiconductor and advanced materials research customers.

Market position

Strengths4 records

Weaknesses4 records

Competitive moat5 records

Key risks6 records

Key highlights6 records

Customer concentration

• LinkedInlinkedin.com/company/otsuka-electronics-suzhou

Revenue estimate

Valuation estimate

Number of profiles

Profiles1 record

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about 大塚电子(苏州)有限公司 / Otsuka Electronics (Suzhou) Co., Ltd.