What Cyber Technologies does

cyberTECHNOLOGIES GmbH, headquartered in Eching-Dietersheim near Munich, Germany, designs and manufactures non-contact, high-resolution 3D optical metrology systems for semiconductor manufacturing and precision R&D applications. Founded in 1992 (originally as cyberOptics GmbH), the company builds a modular multi-sensor platform integrating up to six optical technologies — chromatic confocal sensors, white light interferometers, infrared interferometers, confocal microscopes, reflectometers, and 235-megapixel ultra-high-resolution cameras — into systems ranging from table-top profilometers (VANTAGE series) to advanced benchtop metrology (CT 150/300/350/350T/450G/600S/600ST) and fully automated wafer metrology cells (AL 200S/200D). Documented performance specifications include z-resolution down to 0.1 nm and acquisition speeds up to 36 million datapoints per second, addressing wafer front-end and back-end processes including wafer bow/warp, thickness variation (TTV, LTV), thin-film metrology, advanced packaging, bumps, wirebond, thermal warpage, and panel-level measurements.

The company operates an enterprise sales model led from its German headquarters, complemented by wholly-owned subsidiaries in Chandler, Arizona (USA, founded 2003) and Shanghai (China Metrology Center), and a global distribution partner network covering Belgium, Netherlands, Luxembourg, France, the United Kingdom, India, Japan, Malaysia, Korea, Singapore, China, and Taiwan. Revenue streams include metrology hardware sales (VANTAGE, CT, AL series), perpetual and bundled software licenses (ScanCT for manual analysis, AScan for automation, M-Link for production control with SECS/GEM integration), and service contracts (on-site and remote service, spare parts, training, application support). Pricing is quote-based due to high customization; ISO 9001:2015 and ISO 14001:2015 certifications support enterprise procurement and ESG-mandated sales cycles.

cyberTECHNOLOGIES serves a primary semiconductor vertical (front-end and back-end fabs, advanced packaging) and a secondary R&D/laboratory vertical (academic and industrial research). Named customer logos include NASA, BMW, MIT, and Bosch. The privately held GmbH (Munich HRB 219863) employs 11-50 staff and has no documented external institutional, private equity, or venture capital investment. Management participation rests with co-founder Karl Blöchl (Founder & CEO), Erwin J. Schimmer (CEO), Dr. Bastian Lindl (CTO), and Frank Kemnitzer (COO) — a leadership team with more than 25 years of continuous collaboration. Recent strategic activity includes a partnership with UnternehmerTUM (announced March 30, 2026) for innovation sourcing and dual ISO certifications completed in 2025.

Name

Cyber Technologies

Legal name

cyberTECHNOLOGIES GmbH

Website

https://cybertechnologies.com

Company type

Private

Founded year

1992

Operating status

Operating

Headcount range

1–10 employees

Short description

cyberTECHNOLOGIES GmbH, founded 1992 in Germany, designs and manufactures non-contact, high-resolution 3D optical metrology systems using chromatic confocal, white light interferometry, and multi-sensor platforms, primarily serving semiconductor manufacturers and R&D laboratories worldwide.

Ownership category

akta.pro rank

Product category

Semiconductor Metrology Systems

NAICS

Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451), Other Measuring and Controlling Device Manufacturing (334519), Analytical Laboratory Instrument Manufacturing (334516)

SIC

Optical Instruments & Lenses (3827), Measuring & Controlling Devices, Nec (3829), Laboratory Analytical Instruments (3826)

akta.pro primary industry

Metrology & Dimensional Measurement (CMMs, laser trackers, gauges, surface/roughness) (IMAGAFAD)

akta.pro secondary industries

Machine Vision & Optical Sensing (Cameras, 3D vision, LiDAR, illumination) (IMAGAFAB), Metrology, Inspection & Machine Tool Accessories (CMMs, Probing, Gauging) (IMAHADAK)

Keywords

• Optical metrology systems
• Semiconductor measurement equipment
• Wafer inspection systems
• Surface profilometers
• Precision measurement sensors

Headquarters

HQ city

Eching

HQ country

Germany

HQ region

Europe

Offices7 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Personnel, Supply Chain, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Metrology Systems (Hardware): Sale of optical metrology systems including VANTAGE series (table-top profilometers), CT series (advanced metrology systems), and AL series (fully automated wafer metrology cells). Systems are customized with various sensor configurations and options.
2. Software Products: Software products including ScanCT (manual analysis), AScan (automation), and M-Link (production control). Software is sold as standalone products and bundled with hardware systems.
3. Service & Support: On-site system service, remote service, spare parts, software updates, training (on-site and remote), and application support.

Go-to-market motion1 record

Distribution channels4 records

Marketing channels5 records

Core offering

cyberTECHNOLOGIES designs, develops, and manufactures non-contact optical metrology systems that combine precision-engineered hardware with proprietary software for semiconductor manufacturing and R&D applications. The portfolio spans table-top profilometers (VANTAGE series), advanced metrology systems (CT series) supporting up to six interchangeable sensor technologies, and fully automated wafer metrology cells (AL series), complemented by ScanCT, AScan, and M-Link software products.

Product overview

cyberTECHNOLOGIES offers a comprehensive portfolio of optical metrology systems designed for semiconductor, electronics, and precision manufacturing applications. The product architecture centers on three tiers of table-top and advanced systems (VANTAGE, CT, and AL series) that share a modular sensor platform supporting six optical technologies (chromatic confocal, interferometer, confocal microscope, white light interferometer, reflectometer, and ultra-high-resolution camera). The software ecosystem includes Scan CT for manual analysis, AScan for automation, and M-Link for production management, enabling customers to select configurations from compact 2D profilometers (VANTAGE 1) to fully automated dual-arm wafer metrology cells (AL 200D). Systems range from 50 mm measurement length to 650 x 650 mm², with sensor resolution from 0.1 nm to 36 million datapoints per second.

Differentiator

Problem solved

Functional benefit

Products and services

• VANTAGE 1 A compact 2D profilometer for high-resolution manual and semi-automated measurements on lengths up to 50 mm, featuring automatic scan axis with 50-nanometer encoders and integrated chromatic confocal or interferometer sensors.
• VANTAGE 2 A compact 3D profilometer/interferometer for high-accurate non-contact measurements on areas up to 200 x 200 mm², supporting both 2D and 3D analysis with over 500 surface and thickness analyses.
• CT 150 A compact metrology system for R&D and laboratories with 148 x 148 mm² measurement area, supporting up to six different non-contact sensor technologies for applications including heights, thickness, roughness, and coplanarity.
• CT 300 A versatile non-contact surface metrology system for production and laboratory with 315 x 315 mm² scanning area, supporting up to six sensor technologies for applications including coplanarity, height, angle, and critical dimensions.
• CT 350 A versatile non-contact surface metrology system for production and laboratory with 350 x 350 mm² scanning area, supporting up to six sensor technologies and various automation options including conveyor link.
• CT 350T A double-sided metrology system measuring absolute thickness (TTV, LTV), flatness, heights, coplanarity, and top/bottom surface positions simultaneously with sub-micron accuracy on areas up to 329 x 329 mm².
• CT 450G An advanced metrology system built on a robust gantry platform for large samples, probe cards, and thermal warpage measurements with 450 x 450 mm² travel range, supporting optional heating chamber or conveyor-based configurations.
• CT 600S A non-contact 3D surface measurement system engineered for high-resolution measurement on areas up to 650 x 650 mm² and beyond, built on granite base for stability with 50 nm resolution on each axis.
• CT 600ST A double-sided non-contact surface measurement system for large-scale applications, measuring top and bottom surfaces with absolute thickness and thickness variations on areas up to 600 x 600 mm².
• AL 200S A fully automated wafer metrology cell integrating a CT300 or CT350T unit with automated wafer handling for wafers from 4 to 8 inches, maximizing throughput for front-end semiconductor applications.
• AL 200D A fully automated wafer metrology solution featuring two dockable CT300 or CT350T units with dual-arm handling for maximum throughput, supporting wafers from 4 to 8 inches.
• Chromatic Confocal Sensors High-speed non-contact point, compact point, mini point, and line sensors with resolution down to 3 nm and speeds up to 36 million datapoints per second for versatile measurements across materials.
• Interferometer Sensors Infrared interferometer sensors with resolution down to 1 nm for measuring thickness of transparent materials such as silicon and glass, available in various models with up to 70,000 datapoints per second.
• Confocal Microscope Spinning disk confocal microscope with z-resolution down to 1 nm and speeds up to 1.15 million datapoints per second, featuring interchangeable objectives and automatic turret for various magnifications.
• 3D White Light Interferometer 3D white light interferometer with z-resolution down to 0.1 nm for measuring smallest step heights and surface roughness on smooth surfaces like mirrors, also available in high-speed versions.
• Reflectometer (RFM) Reflectometer sensors for fast thin-film measurements in production environments, measuring films down to 10 nm thickness with 0.01 nm resolution.
• Ultra-High Resolution Camera 235-megapixel camera for high-accuracy lateral measurements, available in monochrome and RGB versions with pixel shifting for enhanced resolution up to 15360 x 15360 pixels.
• ScanCT Manual 2D and 3D measurement and analysis software featuring over 500 built-in analyses and data operations, supporting multi-sensor switching and templates for streamlined workflows.
• AScan Automation software for fully automated measurement and analysis routines, featuring automated fiducial alignment, code reader integration, step-and-repeat batch measurement, and optional SECS/GEM support.
• M-Link Production software for controlling handling and multiple metrology systems with touch-screen optimized interface for cleanroom environments, featuring real-time overview and SECS/GEM integration.
• Service & Support On-site system service, remote service, spare parts, software updates, training (on-site and remote), and application support for cyberTECHNOLOGIES products.

Quantifiable outcome

• Z-resolution down to 0.1 nanometer for surface measurements
• +3 more outcomes

Named customers4 records

Segments2 records

Ideal customer profiles3 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Integration1 record

Feature9 records

Partnerships

Two partnerships are on record, tiered core and major.

• UnternehmerTUMcoreStrategic or Co-development Partner · 30 March 2026Strategic partnership with Europe's leading startup hub to drive innovation and early access to emerging technologies. The collaboration aims to foster dynamic exchange between cyberTECHNOLOGIES' industry leadership and agile startups, creating pathways to identify disruptive innovations at early stages and translate them into real-world applications.
• AccelonixmajorChannel Partner/ Reseller/ DistributorRegional distribution partner covering Belgium, Netherlands, Luxembourg (Accelonix BV), France (Accelonix SAS), and United Kingdom (ACCELONIX Limited). Partners provide local sales, support, and application assistance for cyberTECHNOLOGIES products in European markets.

Scale indicators3 records

Recent moves12 records

Expansion highlights6 records

Broad incumbents

• KLA Corporation: Dominant US-based supplier of process control and yield management solutions for the semiconductor industry. While much larger and broader, KLA competes with CyberTECHNOLOGIES in wafer and packaging metrology, particularly at Tier-1 fabs.
• Bruker Corporation: US-listed maker of scientific instruments including advanced optical/metrology tools and stylus profilers for semiconductor and materials research. Overlaps with CyberTECHNOLOGIES' surface metrology and R&D offerings.
• Keyence Corporation: Japanese manufacturer of sensors, measuring systems, and machine vision products used across industrial automation, electronics, and semiconductor inspection. Overlaps with CyberTECHNOLOGIES' non-contact optical sensors and profilometers.
• Hexagon Manufacturing Intelligence: Division of Hexagon AB providing industrial metrology and quality control solutions including optical and white-light interferometry systems. Indirect competitor in the precision surface measurement space.
• Onto Innovation: US-based semiconductor process control company formed from the merger of Nanometrics and Rudolph, providing optical metrology and inspection for advanced packaging and wafer fab. Competes with CyberTECHNOLOGIES in packaging/wafer metrology at Tier-1 customers.

Direct peers

• Renishaw plc: UK-based precision engineering company offering a wide range of measurement and motion-control products, including optical encoders and surface profilers for semiconductor and industrial metrology. Comparable in end-market and product philosophy.
• Micro-Epsilon: German-based manufacturer of non-contact optical sensors and measurement systems (including confocal and interferometric sensors) for industrial, semiconductor, and R&D applications. Closely comparable to CyberTECHNOLOGIES in technology stack, product type, and customer base.
• Precitec GmbH & Co. KG: German manufacturer of optical metrology and sensor systems, including confocal/chromatic and interferometric sensors used in production metrology and laser material processing. Highly comparable product portfolio and technology base.
• Zygo (AMETEK): AMETEK subsidiary specializing in optical metrology — interferometers, profilometers, and 3D optical sensors — for precision surfaces, optics, and semiconductor applications. Direct competitor in white light interferometry and high-precision profiling.
• Sensopart: German specialist in optical sensors, laser distance measurement, and confocal measurement technology for industrial automation and quality control. Comparable German mid-sized vendor with similar optical-measurement focus.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat4 records

Key risks6 records

Key highlights7 records

Customer concentration

• YouTubeyoutube.com/@cybertechnologies1
• LinkedInlinkedin.com/company/cybertechnologies
• Facebookfacebook.com/cybertechnologies

Compliance2 records

Revenue estimate

Valuation estimate

Number of profiles

Profiles4 records

Subsidiaries2 records

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Cyber Technologies