What Gaertner Scientific Corporation does

Gaertner Scientific Corporation is a privately held US precision optical instrument manufacturer founded in 1896 in Chicago and now headquartered in Skokie, Illinois. The company designs, manufactures, and sells Stokes laser ellipsometers (LSE-USB, LSE-MS Microspot, LSE-WS WAFERSKAN, and multiwavelength L2W/L3W models) for non-contact thin-film thickness and refractive-index measurement, alongside measuring microscopes (M101B, M110BEE, M303 series), the Differential Stress Refractometer (LDSR) for glass stress, and the Z87.1 Mini-Dioptometer for ANSI Z87.1-2015 eyewear compliance testing. Core technology centers on the trademarked StokesMeter™ photopolarimeter architecture, which uses four photodetector surfaces with no moving parts or modulators to simultaneously measure all four Stokes parameters, paired with a HeNe gas laser at 6328Å (the NIST primary-standard wavelength) for high-precision ellipsometry.

The company sells directly to industrial, research, educational, and government laboratories via its website, phone, and email—globally but with a single disclosed US facility. Hardware sales are quote-based, supplemented by NIST-traceable and Gaertner-label calibration standards (priced at $1,325 and $695 respectively), a $995 recertification service, LGEMP/LMOD Windows software, USB interface upgrades for legacy ellipsometers, factory-refurbished pre-owned instruments, and add-on cameras and accessories. Primary end markets are semiconductor and solar thin-film metrology, glass manufacturing QC, eyewear/industrial safety testing, and academic/government research labs.

Gaertner has been under continuous private ownership since 1978, when present management acquired it from American Machine & Science Inc. The business carries CE, CDRH, and ANSI Z87.1-2015 certifications, and its StokesMeter and multiwavelength ellipsometer technologies have been recognized with Photonics Spectra and R&D 100 awards. The company maintains a niche, defensible position in high-precision laser ellipsometry and precision optical instrumentation but discloses no revenue, headcount, or external funding.

Name

Gaertner Scientific Corporation

Legal name

Gaertner Scientific Corporation

Website

https://gaertnerscientific.com

Company type

Private

Founded year

1896

Operating status

Operating

Headcount range

11–50 employees

Short description

Gaertner Scientific Corporation is a privately held, 129-year-old US manufacturer of precision optical instruments—primarily Stokes laser ellipsometers, measuring microscopes, glass-stress refractometers, and ANSI Z87.1 eyewear compliance systems—sold directly to semiconductor, solar, glass, safety, and research laboratories worldwide.

Ownership category

akta.pro rank

Headquarters

HQ city

Skokie

HQ country

United States

HQ region

North America

Offices1 record

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Personnel, Operations, Technology or R&D, Supply Chain, Marketing or Sales

Revenue model

1. Precision Optical Instruments: Manufacture and sale of ellipsometers (LSE-USB, LSE-MS, LSE-WS, multiwavelength models), measuring microscopes (M101B, M110BEE, M303 series), differential stress refractometers, and Z87.1 mini-dioptometers. One-time hardware sales of specialized scientific instruments.
2. Software and Upgrades: Windows software programs LGEMP and LMOD for ellipsometer measurement and film modeling. USB interface upgrades for older ellipsometer models (L116, L115, LSE). 2D/3D color mapping software upgrades for WAFERSKAN models.
3. Calibration Standards and Services: NIST traceable silicon wafer calibration standards ($1325 each) and Gaertner label standards ($695 each). Recertification services ($995). Standards are silicon wafers with thermally grown silicon dioxide film for ellipsometer calibration.
4. Pre-Owned Equipment: Factory refurbished, upgraded pre-owned laser ellipsometers (L116 and L115 models) sold with full 1-year warranty at substantially lower prices for budget-conscious companies and universities.

Pricing tiers

Go-to-market motion1 record

Distribution channels1 record

Marketing channels2 records

Core offering

Gaertner Scientific Corporation designs and manufactures precision laser ellipsometers for non-contact thin film thickness and refractive index measurement, along with measuring microscopes, differential stress refractometers for glass, eyewear compliance dioptometers, NIST-traceable calibration standards, and supporting Windows software. Products serve semiconductor, solar, chemical, biological, glass manufacturing, eyewear safety, research, educational, and government laboratory customers worldwide.

Product overview

Gaertner Scientific Corporation is a precision optical instrument manufacturer with over 129 years of history, specializing in ellipsometers for thin film measurement and measuring microscopes for dimensional measurements. The core product line includes Stokes Laser Ellipsometers (LSE-USB, LSE-MS Microspot, LSE-WS WAFERSKAN) that use advanced StokesMeter technology for non-contact thin film thickness and refractive index measurements to sub-angstrom precision, along with Multiwavelength Laser Ellipsometers (L2W and L3W) offering two and three wavelength options. The product portfolio extends to measuring microscopes (Modular M101B, Micrometer M110BEE), precision linear slides with USB cameras (M303USB, M303LM), the Differential Stress Refractometer LDSR for glass stress measurement, and the Z87.1 Mini-Dioptometer for eyewear safety compliance testing. Supporting products include NIST Traceable Calibration Standards, LGEMP and LMOD Windows software programs, USB interface upgrades for legacy models, the StokesMeter Polarimeter, and the Electronic Eyepiece Micrometer M202EE. The company also offers factory refurbished pre-owned ellipsometers and calibration services.

Differentiator

Problem solved

Functional benefit

Products and services

• Stokes Laser Ellipsometer LSE-USB Stokes Laser Ellipsometer with USB interface using StokesMeter technology and HeNe Gas Laser at 6328Å for thin film thickness and refractive index measurement to sub-angstrom precision; targets semiconductor, solar, chemical, biological, and thin film industries.
• Stokes Microspot Laser Ellipsometer LSE-MS Microspot ellipsometer with 15-micron measuring beam diameter, manual XY micrometer positioning, and CCD camera for measuring small features on samples up to 300mm wide; targets micro-electronics and thin film research labs.
• Stokes WAFERSKAN Laser Ellipsometer LSE-WS High-speed film thickness mapping system measuring one site per second including stage travel, producing tilt-free 2D/3D color thickness and index maps on wafers up to 300mm; targets semiconductor wafer fabs.
• Multiwavelength Laser Ellipsometer L2W & L3W Two- and three-wavelength ellipsometers using 405nm, 544nm, 633nm, and 830nm laser sources to resolve thickness period ambiguity, analyze difficult films, and measure refractive index in near-period regions.
• Pre-Owned Laser Ellipsometers Factory refurbished and upgraded L116 and L115 variable-angle laser ellipsometers sold with a 1-year warranty at substantially lower prices for budget-conscious companies and universities.
• Modular Microscope M101B Compact modular microscope with sleeve focusing, interchangeable objectives and eyepieces for varying working distance, field of view, and magnification; used in measurement and inspection setups.
• Micrometer Microscope M110BEE Measuring microscope equipped with M202EE electronic eyepiece micrometer, reading to 0.0001mm at 25X magnification with 4.7mm range and 67mm working distance; targets precision manufacturing and QC labs.
• Micrometer Slide M303USB Camera System Linear encoder micrometer slide with USB pencil camera for precise linear measurement to 0.0005mm (20 millionths inch), 0 to 5.25 inch travel, with M303XY 2-axis configuration option.
• Differential Stress Refractometer LDSR Non-destructive measurement of compression and tensional stresses in commercial float, plate, and sheet glass via total internal reflection technique; targets glass manufacturing QC.
• Z87.1 Mini-Dioptometer System ANSI Z87.1-2015 compliant system for testing goggles, welder's lenses, and eyeglasses for refractive power, prismatic power, and definition, reading directly to 0.01 diopter; targets eyewear manufacturers and OSHA compliance testing facilities.
• StokesMeter Polarimeter Advanced photopolarimeter that simultaneously measures all four Stokes parameters of light without moving parts or modulators; offers Mueller matrix ellipsometry capability and millisecond measurement speed.
• NIST Traceable Calibration Standards Silicon wafers with thermally grown silicon dioxide film in 20 to 2000 Angstrom thicknesses for high-accuracy ellipsometer calibration, with NIST traceability documentation; L118N series at $1,325 and L118G series at $695 per standard.

Quantifiable outcome

• Sub-Angstrom precision and repeatability over most of the measurement range for film thickness
• +3 more outcomes

Segments5 records

Ideal customer profiles5 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Integration9 records

Feature6 records

Partnerships

One partnership is on record.

• National Institute of Standards and Technology (NIST)coreStrategic or Co-development PartnerGaertner calibration standards are traceable to NIST primary standards. Measurements are performed at the same HeNe laser wavelength (6328Å) and 70° angle of incidence as NIST. NIST traceability enables compliance for regulated industries.

Scale indicators3 records

Recent moves8 records

Expansion highlights5 records

Broad incumbents

• Horiba Scientific: Part of the Horiba group offering spectroscopic ellipsometers (UVISEL, Auto SE) within a broader scientific instruments portfolio spanning spectroscopy, fluorescence, and elemental analysis. Competes with Gaertner in ellipsometry but as one product line within a much larger instrumentation business.
• Evident Corporation (formerly Olympus Industrial): Industrial microscopes, measuring instruments, and optical metrology systems for scientific and industrial applications. Competes with Gaertner's measuring microscope product line as part of a broader industrial imaging and measurement portfolio serving manufacturing QA and research customers.
• Zygo Corporation (Ametek): Precision optical metrology including interferometers, profilometers, and laser-based measurement systems, operating within Ametek's electronic instruments group. Serves similar industrial and research customers as Gaertner in precision dimensional and surface measurement.
• KLA Corporation: Major semiconductor process control and yield management company with a dominant share of advanced fab metrology. KLA's broad thin film and optical CD metrology portfolio competes with Gaertner at the high end of semiconductor customers, though Gaertner targets more specialized and research-oriented applications.
• Semilab: Hungarian-headquartered semiconductor metrology company offering ellipsometers and broader optical and electrical measurement systems (four-point probe, CV, lifetime). Competes with Gaertner in thin film measurement while serving semiconductor customers with a wider metrology portfolio.
• Onto Innovation Inc. Semiconductor process control company formed from the merger of Rudolph Technologies and Nanometrics, offering optical critical dimension (OCD) and thin film metrology for advanced nodes. Competes with Gaertner in semiconductor thin film measurement at the larger fab customer tier.

Direct peers

• SENTECH Instruments GmbH: German manufacturer of laser and spectroscopic ellipsometers alongside plasma deposition and etching equipment. Serves the same semiconductor, photovoltaic, and research laboratory customers as Gaertner with comparable thin film measurement capabilities and a similar specialty instrumentation positioning.
• Nikon Metrology: Industrial measuring microscopes, optical metrology, and 3D coordinate measurement systems. Directly competes with Gaertner's measuring microscope product line (M101B Modular, M110BEE Micrometer, M303 series) for industrial dimensional measurement customers.
• J.A. Woollam Co., Inc. The leading manufacturer of spectroscopic ellipsometers (VASE, M-2000, IR-VASE series), and the most direct competitor to Gaertner in thin film metrology. Both companies serve semiconductor, solar, and research customers with ellipsometer-based thin film characterization, differing primarily in single/multi-wavelength vs. spectroscopic approach.

Emerging players

• Accurion GmbH: Specializes in imaging ellipsometry and Brewster angle microscopy for thin film and surface analysis. Serves similar research and industrial customers as Gaertner with a complementary imaging-based approach rather than direct laser ellipsometry, but addresses overlapping application spaces.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat4 records

Key risks5 records

Key highlights7 records

Customer concentration

• LinkedInlinkedin.com/company/gaertner-scientific-corp

Compliance3 records

Revenue estimate

Valuation estimate

Number of profiles

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Gaertner Scientific Corporation