Name

NAPSON

Legal name

ナプソン株式会社

Website

https://napson.co.jp

Company type

Private

Founded year

1984

Operating status

Operating

Headcount range

11–50 employees

Ownership category

akta.pro rank

Product category

Semiconductor Measurement Equipment

NAICS

Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals (334515), Semiconductor Machinery Manufacturing (333242)

SIC

Instruments For Meas & Testing Of Electricity & Elec Signals (3825), Industrial Instruments For Measurement, Display, And Control (3823), Measuring & Controlling Devices, Nec (3829)

akta.pro primary industry

Test & Measurement Equipment (Oscilloscopes, DAQ, signal analyzers, calibration benches) (IMAGAFAC)

akta.pro secondary industry

Test, Probe & Burn-In Equipment (Wafer Sort/Final Test) (HDAHAEAJ)

Keywords

• Resistivity measurement equipment
• Sheet resistance meters
• Four-point probe systems
• Non-contact eddy current testing
• Semiconductor wafer inspection

Headquarters

HQ city

Koto

HQ country

Japan

HQ region

Asia

Offices3 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Personnel, Technology or R&D, Operations, Marketing or Sales, Supply Chain, Infrastructure

Revenue model

1. Hardware Sales - Resistivity and Sheet Resistance Measurement Equipment: Napson generates revenue primarily from manufacturing and selling resistivity and sheet resistance measurement instruments. Product lines span manual, semi-automatic, and fully automatic systems for both contact (4-point probe) and non-contact (eddy current) methods, as well as inline/integrated measurement modules, PN testers, lifetime testers, wafer flatness testers, probe heads, and reference wafers.
2. Aftermarket Services - Calibration, Maintenance, and Repair: Annual calibration, inspection, and maintenance services for installed equipment. Includes NIST/VLSI-traceable calibration using standard resistors and reference samples. Products carry a 1-year warranty. Old product support is offered with some limitations for units over 10 years old.

Go-to-market motion2 records

Distribution channels7 records

Marketing channels5 records

Core offering

NAPSON designs, manufactures, and sells resistivity (Ω·cm) and sheet resistance (Ω/□) measurement instruments for semiconductor wafers, flat panel displays, solar cells, and advanced functional thin films. The lineup covers manual, semi-automatic, fully automatic, and inline-integrated systems using both contact (4-point probe) and non-contact (eddy current) methods, with proprietary extensions for ultra-high resistance (corona discharge) and ultra-low resistance (pulse voltage excitation). NAPSON is the only manufacturer in the world that develops and sells both contact and non-contact measurement systems.

Product overview

NAPSON is a specialized manufacturer of resistivity and sheet resistance measuring instruments, established in 1984. The company offers both contact-type (4-point probe method) and non-contact type (eddy current method) measurement systems as two distinct product lines. The contact-type product line includes WS-8800, WS-3000, RG-2000AL/RG-3000AL, RT-3000/RS-1300 (full-auto), Cresbox, RT-3000/RG-2000, RG-200PV (semi-auto), RT-70V series, TCR-600, and DUORES (manual). The non-contact product line includes NC-6800FLA, NC-2000FLA, NC-600MAP (full-auto), NC-80MAP, CRN-100 (semi-auto), EC-80, EC-80P, DUORES, PVE-80 (manual), and NC-110, NC-600/NC-700 (inline modules). Additional products include FLA-200 flatness measurement, HF-90R/HF-100DCA lifetime testers, SRS-2010 spreading resistance meter, PN-12α/PN-50α/PN-8LP/PN-100BI PN judgment instruments, 4-point probe heads, NRW series reference wafers, and FilmTeK distributed products. NAPSON is the only manufacturer in the world that develops and manufactures both contact and non-contact resistance measurement systems.

Differentiator

Problem solved

Functional benefit

Brands

• CRN-100: Non-contact (corona discharge method) ultra-high resistance range sheet resistance measurement system
• PVE-80
• DUORES
• NRW Series

Products and services

• WS-8800 4-point probe method fully automatic wafer robot-handling sorting system for silicon wafers; supports thickness measurement, PN judgment, and temperature measurement with self-test function and wide measurement range.
• WS-3000 4-point probe method automatic thin-film sheet resistance measurement system for semiconductor process evaluation; features probe-changer mechanism for 4 probe-head types, high-speed measurement, and 3 nm thin-film measurement capability. Supports FOUP load port and GEM/SECS.
• RG-2000AL (RG-3000AL) 4-point probe method resistivity and sheet resistance measurement system with cassette station; world-top measurement range with programmable measurement patterns and round/square mapping software.
• RT-3000 / RS-1300 World-standard 4-point probe method fully automatic measurement system for flat-panel displays; supports 0.1 mm pitch, programmable measurement patterns, CIM communication, and substrates up to 1,500 × 1,850 mm including LTPS and IGZO silicon thin films.
• Cresbox 4-point probe method tester and stage-integrated semi-automatic resistivity and sheet resistance measuring instrument for silicon materials; provides thickness, peripheral position, and temperature correction functions.
• RT-3000 / RG-2000 (RG-3000) 4-point probe method wide-range resistivity and sheet resistance semi-automatic measuring instrument with programmable measurement patterns and round/square measurement-compatible mapping software.
• RG-200PV 4-point probe method resistivity and sheet resistance measuring instrument for solar cells; features X-Y stage for multi-point measurement at equal or random pitch with 2-D/3-D mapping software.
• RT-70V Series 4-point probe method manual resistivity and sheet resistance measuring instrument; pairs the RT-70V tester with interchangeable stages (motor-driven auto, manual lever, X-Y) for glass substrates and films.
• TCR-600 4-point probe method temperature-controlled high-temperature resistance measuring instrument; controls sample temperature from room temperature to 600 °C in automatic steps, with vacuum control, inert gas replacement, and water-cooled chiller.
• DUORES (Contact Configuration) Handheld sheet resistance measuring instrument compatible with both 4-point probe (contact) and non-destructive eddy-current (non-contact) probes; contact probe range 0.001–4,000 Ω/□, stores up to 50,000 records, 24-hour battery.
• NC-6800FLA Non-contact (eddy current) fully automatic belt-conveyor wafer sorting system that measures resistivity, thickness, and PN junction non-destructively; uses eddy current for resistivity and electrostatic capacitance for thickness.
• NC-2000FLA Non-contact (eddy current and electrostatic capacitance) fully automatic sorting system that measures resistivity, flatness (thickness), and PN junction non-destructively with temperature compensation.
• NC-600MAP Non-contact (eddy current) resistivity and sheet resistance measurement system with cassette station; optimal for production management of silicon wafers and compound semiconductors, with multiple non-contact probes for wide-range measurement.
• NC-80MAP Non-contact (eddy current) wide-range resistivity and sheet resistance semi-automatic measuring instrument with multiple non-contact probes; optional wafer thickness measurement probe available.
• CRN-100 Non-contact (corona discharge method) ultra-high resistance range sheet resistance measuring instrument; measures 10^9 to 10^15 Ω/□ that were previously impossible with non-contact methods. Provides 2-D/3-D mapping and CSV output. Patent 5510629 (joint with Yamagata University; subsequent joint patent 6564494).
• EC-80 Non-contact (eddy current method) manual resistivity and sheet resistance measuring instrument; simple insertion of the sample between probes for measurement.
• EC-80P (Portable) Non-destructive (eddy current method) handheld resistivity and sheet resistance measuring instrument; simple handheld probe contact for measurement, with mode switching between resistivity and sheet resistance.
• PVE-80 Non-contact (pulse voltage excitation method) ultra-low resistance range sheet resistance measuring instrument; world-first to achieve 50 µ to 1 m Ω/sq measurement non-destructively. Compact design for samples up to A4 size. Patent 5386394 (with Chiba University).
• NC-110 (NC-110PV) Non-contact (eddy current) built-in resistivity measuring module for integration into customer manufacturing lines or robot systems; LAN connection to host PC, supports silicon, poly-silicon, SiC, GaAs Epi, GaN Epi, and InP wafers.
• NC-600 / NC-700 Non-contact (eddy current) built-in sheet resistance measuring modules for flat panels and film samples; enables inline continuous measurement of conductive films on PET film and other substrates, with customizable probe count for R&D through production-line deployments.
• FLA-200 Non-contact wafer flatness measurement system using a 5 mmφ electrostatic capacitance probe; measures TTV, BOW, WARP, and thickness with 12,000-point scan in under 60 seconds. ASTM-compliant.
• HF-90R Non-contact (photoconductivity decay method) silicon ingot lifetime measuring instrument; measures JIS Tanzaku-shaped silicon monocrystals using an oscilloscope and PC dedicated software.
• HF-100DCA Silicon ingot lifetime measuring instrument using the JIS DC method; contact measurement for silicon ingots, JIS Tanzaku shapes, and ingot states (mono/polycrystalline silicon).
• SRS-2010 2-probe method spreading resistance measuring instrument; analyzes depth-direction resistivity distribution, epitaxial layer thickness, PN junction depth, and carrier concentration distribution.
• PN-12α Contact-type thermoelectromotive method PN judgment instrument with integrated pen-type hot/cold probe; determines conductive type by contact for monocrystalline silicon wafers, bulk, and ingots.
• PN-50α Non-contact photovoltaic method PN judgment instrument (Patent 2018748); LED light pulse enables instant judgment without sample damage. Can judge wafers with surface oxide film and ingot blocks.
• PN-8LP Non-contact pen-type PN judgment instrument using laser light; battery-powered (AA) for portability, instant PN judgment with a single button press, non-destructive laser irradiation.
• PN-100BI Non-contact laser-based PN judgment module for solar-cell wafers; single-side probe design for integration into customer conveyor systems; supports 156 × 156 mm and 210 × 210 mm wafers.
• 4-Point Probe Heads 4-point probe heads for resistivity and sheet resistance measuring systems; available in NAPSON original cartridge type and Jandel original type, in various tip materials (tungsten carbide, osmium alloy) and tip radii from 25 µm to 500 µm.
• NRW Series Resistivity Reference Wafers Resistivity reference wafers certified by NAPSON's strict measurement standards using neutron-irradiated stable wafers; complies with SEMI and JIS standards; multiple resistivity ranges from 16 to 550 Ω·cm.
• FilmTeK (Optical Thin-Film Measurement System) Optical thin-film measurement system and analysis software for n, k, and thickness measurement distributed by NAPSON as Japan exclusive agent for SCI (Scientific Computing International, USA).
• Annual Calibration, Inspection, and Maintenance Services Annual calibration, inspection, and maintenance services for installed NAPSON equipment; NIST/VLSI-traceable calibration using standard resistors and reference samples; 1-year product warranty. Support is offered with limitations for products older than 10 years.
• Demo Measurement Service Demo measurement of customer samples at the Chiba Technology Center using standard NAPSON equipment, available on request to support product selection prior to purchase.

Quantifiable outcome

• Napson's RT-3000/RS-1300 is described as the 'world standard' sheet resistance measurement system for the flat panel industry.
• +3 more outcomes

Named customers33 records

Segments5 records

Ideal customer profiles5 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Feature7 records

Partnerships

13 partnerships are on record, tiered core and minor.

• Napson Korea Co., Ltd.coreChannel Partner/ Reseller/ Distributor · 1 July 2004Napson's wholly-owned subsidiary established in Seoul, South Korea in July 2004. Handles direct sales, distribution, service, and support for Napson products in the Korean market. Located at Room 1810, U-TOWER, 120 Heungdeokjungang-ro, Giheung-gu, Yongin-si, Gyeonggi-do.
• Quatek International Limited (Taiwan Branch)coreChannel Partner/ Reseller/ DistributorExclusive agent for Napson products in Taiwan. Located at 4/F, 308 Sec 1 Nei Hu Road, Nei Hu, Taipei 11493, Taiwan. Handles sales and technical support for Napson resistivity and sheet resistance measurement equipment.
• Quatek Inc. (Shanghai)coreChannel Partner/ Reseller/ DistributorExclusive agent for Napson products in mainland China. Located at Unit 2112, 21F, Yong Sheng Towers, 2025 West Zhong Shang Road, Shanghai. Represents Napson at SEMICON China exhibitions.
• Nanyang Equipment Pte LtdminorChannel Partner/ Reseller/ DistributorDistributor for Napson products in Singapore and Malaysia. Contact: Mr. Tony Wong at [email protected]. Located at 28 Genting Lane, #04-06 Platinum28, Singapore 349585.
• Caltron Pte LtdminorChannel Partner/ Reseller/ DistributorDistributor for Napson products in Singapore. Located at 9 Kallang Place, #05-12, Singapore 339154. Website: https://www.caltron.sg/.
• EURIS GmbHcoreChannel Partner/ Reseller/ DistributorExclusive agent covering Germany and Northeast Europe. Contact: Mr. Klaus Gailus. Located at Waldmeisterstr. 72, 80935 München, Germany. Participated in SEMICON Europa 2016.
• EURIS SAScoreChannel Partner/ Reseller/ DistributorExclusive agent covering France and Southwest Europe. Contact: Mr. Stephane Sage. Located at Espace Bievre – Building A, 1219 rue Alphonse Gourju, 38140 – Apprieu, France.
• Toho Technology Inc.coreChannel Partner/ Reseller/ DistributorRepresents Napson in the United States. Located at 4809 N. Ravenswood Ave. Suite 113, Chicago, IL 60640. Website: https://tohotechnology.com/.
• Yamagata University (山形大学)coreStrategic or Co-development PartnerJoint research collaboration on non-contact high-resistance measurement using corona discharge method. Yamagata University provided technical cooperation, leading to the development of the CRN-100 product and patent 6564494. A joint patent was obtained in 2019 for the surface resistance measurement method. Yamagata University Prof. Sugimoto (杉本先生) was the key collaborator. Napson also co-developed the non-contact high-resistance measurement technology with Yamagata University, with joint presentations at academic conferences including ICCG 11 in Germany.
• Chiba University (千葉大学)coreStrategic or Co-development PartnerJoint development of the pulse voltage excitation method (パルスVoltage励磁法) for non-contact ultra-low resistance measurement. Patent 5386394 was obtained for this collaborative technology. This led to the PVE-80 product capable of measuring 50μ to 1mΩ/sq non-destructively.
• Dalian University of Technology / 大連理工大学 (China)minorStrategic or Co-development PartnerJoint research laboratory established in January 2007 at Dalian University of Technology in China. The joint research contract was renewed from 2010 to 2012. This partnership supports Napson's technology development for the Asian market.
• SCI (Scientific Computing International, USA)minorChannel Partner/ Reseller/ DistributorJapan General Distributor agreement signed in August 2016 for SCI's FilmTeK optical thin film measurement system and analysis software. Napson serves as the exclusive Japanese distributor, adding complementary optical measurement capability to its product portfolio. Napson exhibited this product at SEMICON Japan 2016.
• EdgeTech (India)minorChannel Partner/ Reseller/ DistributorIndia agent that exhibited Napson products at IWPSD 2015 (International Workshops on Physics of Semiconductor Devices) in India.

Scale indicators5 records

Recent moves9 records

Expansion highlights5 records

Broad incumbents

• KLA Corporation: US-based global leader in semiconductor process control and yield management. Operates broad metrology platforms that increasingly include electrical resistivity measurement (via Capres), making it a much larger incumbent that could encroach on NAPSON's niche through integrated solutions.
• Bruker: US-headquartered scientific instruments company with a significant semiconductor and materials characterization portfolio (Hall effect, AFM, X-ray). Comparable in serving advanced materials research customers with electrical property measurement needs, but at much larger scale and broader scope.
• Onto Innovation: US-headquartered supplier of process control metrology and inspection tools for semiconductor and display manufacturers. Comparable customer base (FPD and wafer fabs) and overlapping capability in thin-film electrical and optical measurement, with substantially greater scale.
• Hitachi High-Tech: Japanese-headquartered global supplier of semiconductor metrology, inspection, and analysis equipment. Operates in overlapping wafer and FPD inspection markets with NAPSON's customers, and represents a potential Japanese large-scale competitor or partner for advanced metrology solutions.

Direct peers

• Lehighton Electronics: US-based manufacturer of non-contact eddy current sheet resistance measurement systems. Directly comparable to NAPSON's non-contact product line (NC/EC series), serving similar semiconductor wafer, FPD, and solar customers.
• Jandel Engineering: UK-based specialist manufacturer of 4-point probe resistivity measurement systems and probe heads. Closest direct competitor to NAPSON in the contact-method segment, with overlapping customer base in semiconductor materials and academic research.
• Capres (a KLA company): Danish developer of 4-point probe (CIPTEC) and non-contact sheet resistance measurement tools for nano-scale semiconductor and thin-film characterization. Now part of KLA, making it a direct competitor in advanced resistivity measurement and a key signal that platform players view this niche as strategic.
• Semilab: Hungarian-headquartered semiconductor metrology company offering a broad range of electrical and optical measurement tools including sheet resistance, lifetime, and dopant measurement. Comparable to NAPSON in core resistivity metrology but with a wider product portfolio and global service network.
• Four Dimensions: US manufacturer of Hall effect and resistivity measurement systems. Comparable to NAPSON in electrical property measurement of semiconductor materials, particularly for van der Pauw and Hall mobility characterization of wafers and thin films.

Others

• Scientific Computing International (SCI): US-based maker of optical thin-film measurement systems (FilmTeK series) — currently distributed by NAPSON as its exclusive Japan agent. Partner/complementary rather than competitor, but adjacent in the thin-film metrology ecosystem NAPSON operates in.

Market position

Strengths4 records

Weaknesses4 records

Competitive moat5 records

Key risks6 records

Key highlights7 records

Customer concentration

• YouTubeyoutube.com/@napsonresistivitymeasureme4953

Compliance10 records

Revenue estimate

Valuation estimate

Number of profiles

Profiles1 record

Subsidiaries1 record

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about NAPSON