Scientific Computing International

What Scientific Computing International does

Scientific Computing International (SCI) is a privately held, Carlsbad, California-based designer and manufacturer of optical thin-film metrology systems, founded in 1993 and operating for 30+ years. Under the FilmTek brand, SCI produces a portfolio of benchtop and production metrology tools built around patented Multi-Angle Differential Polarimetry (MADP), Differential Power Spectral Density (DPSD), parabolic-mirror optics, and multi-modal scatterometry with RCWA, enabling independent measurement of film thickness and refractive index, micro-spot characterization down to 2µm, and non-destructive TSV etch depth measurement to 500µm. Supporting offerings include the Film Wizard optical thin-film design software and the WaferScan wafer geometry platform, addressed at semiconductor fabs and research labs operating at 1x nm design nodes and beyond. SCI also runs an in-house measurement services laboratory staffed by PhD-level scientists for sample characterization work that does not require a tool purchase.

The company serves semiconductor wafer manufacturers, advanced packaging and TSV integrators, photonic integrated circuit and compound semiconductor producers, data storage and flat panel display makers, LED and solar photovoltaic manufacturers, silicon wafer producers, and academic and corporate R&D groups, addressing use cases that include sub-10 nm CD metrology, high-k/low-k characterization, OLED stack measurement, TCO and absorber layer control, and stress-induced wafer bow and warp characterization. SCI earns revenue primarily through capital equipment sales (FilmTek 2000, 3000, 4000, 6000, CD, SE, PAR-SE, TSV product lines) and perpetual software licenses (Film Wizard), supplemented by paid measurement services and recurring technical support, training, and service contracts. Commercial reach is quote-based, with direct enterprise field sales in the United States and a layered network of regional channel partners internationally: Charntec Electronics in the UK and Europe, Bruker Japan K.K.'s Nano-surface Division in Japan, Quatek across Taiwan, China, Thailand, Malaysia, and broader Southeast Asia, Caltron in Singapore, and mhonSONS Semicon in the Philippines.

Name

Scientific Computing International

Legal name

Scientific Computing International

Website

https://sci-soft.com

Company type

Private

Founded year

1993

Operating status

Operating

Headcount range

1–10 employees

Short description

Scientific Computing International designs and manufactures optical thin-film metrology systems under the FilmTek brand, serving semiconductor, advanced packaging, photonics, display, LED, solar, data storage, wafer, and R&D customers worldwide through direct US sales and regional distributors.

Ownership category

akta.pro rank

Product category

Optical Thin-Film Metrology Equipment

NAICS

Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451), Analytical Laboratory Instrument Manufacturing (334516), Other Measuring and Controlling Device Manufacturing (334519)

SIC

Industrial Instruments For Measurement, Display, And Control (3823), Optical Instruments & Lenses (3827), Laboratory Analytical Instruments (3826), Services-Commercial Physical & Biological Research (8731)

akta.pro primary industry

Metrology & Dimensional Measurement (CMMs, laser trackers, gauges, surface/roughness) (IMAGAFAD)

akta.pro secondary industry

Mass Spectrometry & Spectroscopy Instruments (HLAGAIAB)

Keywords

• Optical thin-film metrology
• Spectroscopic ellipsometry systems
• Semiconductor metrology equipment
• Thin film characterization
• CD metrology instruments

Headquarters

HQ city

Carlsbad

HQ country

United States

HQ region

North America

Offices16 records

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Supply Chain, Personnel, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Metrology Hardware Systems: Sale of FilmTek™ metrology instruments including spectroscopic ellipsometers, reflectometers, and combined systems (FilmTek 2000, 3000, 4000, 6000 series, FilmTek CD, FilmTek SE, WaferScan). These are high-value capital equipment sold to semiconductor, display, photonics, and solar manufacturers for thin film and CD measurement in R&D and production environments.
2. Film Wizard Software License: Sale and licensing of Film Wizard Professional thin film design and analysis software for optical coating design, material characterization, ellipsometry, and spectrophotometry. Software provides optimization, synthesis, and analysis capabilities for thin film engineers and scientists.
3. Measurement Services: Sample measurement services performed at SCI's Carlsbad, CA facility using SCI's own metrology systems. Expert team of PhD-level scientists provides detailed analysis reports on customer samples including multi-layer film characterization.
4. Technical Support, Training, and Service Contracts: Technical support, applications support, recipe development, training programs (at headquarters or on-site), and on-site service contracts. Provided via phone, email, and on-site visits through a global network of support offices.

Go-to-market motion2 records

Distribution channels7 records

Marketing channels6 records

Core offering

Scientific Computing International (SCI) designs, manufactures, and sells optical thin-film metrology instruments under the FilmTek brand, including spectroscopic ellipsometers, multi-angle polarized reflectometers, scatterometers, transmission spectrophotometers, and chromatic-confocal wafer geometry systems, used by semiconductor, display, photonics, solar, and data storage manufacturers. The company also sells the Film Wizard thin-film design and analysis software and operates an in-house measurement services laboratory staffed by PhD scientists for sample characterization.

Product overview

SCI offers the FilmTek family of optical metrology systems and Film Wizard software for thin film analysis. The portfolio spans benchtop systems (FilmTek SE, FilmTek 2000 SE, FilmTek 3000 SE) for basic ellipsometry, advanced PAR-SE systems combining spectroscopic ellipsometry with DUV multi-angle polarized reflectometry, PAR/PAR-SE micro-spot systems for patterned wafers, and production-tier systems (FilmTek 6000 PAR-SE, FilmTek CD for critical dimensions, FilmTek 2000M TSV for 3D packaging). Supporting products include FilmTek 2000 and FilmTek 3000 spectrophotometers, FilmTek 4000 for photonic integrated circuits, WaferScan for wafer geometry, and Film Wizard professional software. SCI also provides measurement services from its Carlsbad facility.

Differentiator

Problem solved

Functional benefit

Brands

• FilmTek: FilmTek is SCI's primary product brand for thin film metrology systems, including models such as FilmTek 2000 PAR-SE, FilmTek CD, FilmTek 2000M TSV, FilmTek 6000 PAR-SE, FilmTek 3000, FilmTek 4000, FilmTek SE, and FilmTek 2000M. These systems provide spectroscopic ellipsometry, reflectometry, and scatterometry solutions.
• Film Wizard
• WaferScan

Products and services

• FilmTek 2000 PAR-SE Advanced benchtop metrology system combining spectroscopic ellipsometry (295nm-1700nm) with DUV multi-angle polarized reflectometry (190nm-1700nm). Uses patented MADP and DPSD technology to independently measure film thickness and refractive index. 50µm spot size, 0.03Å repeatability on native oxide, with rotating compensator design. Targets thin film measurement in R&D and production environments.
• FilmTek CD Fully-automated high-throughput Optical Critical Dimension (OCD) and advanced film analysis metrology system. Uses patented multimodal measurement combining scatterometry, ellipsometry, generalized ellipsometry, and RCWA for real-time multi-layer stack characterization and CD measurement at 1x nm design node and beyond. Targets advanced semiconductor node metrology.
• FilmTek 2000M TSV Production metrology system for advanced semiconductor packaging. Measures TSV etch depth, bump height, critical dimension, and film thickness for 3D IC integration. Handles TSV diameters down to 1µm and etch depths up to 500µm with sub-0.005% etch depth precision and wafer throughput above 60 WPH. Targets 3D-IC packaging lines.
• FilmTek 6000 PAR-SE Production-proven optical thin-film metrology system combining spectroscopic ellipsometry and DUV multi-angle polarized reflectometry. Supports 200mm and 300mm wafer metrology for film thickness, refractive index, and stress measurement at 1x nm design node and beyond. Targets high-volume semiconductor manufacturing.
• Film Wizard Professional thin-film design and analysis software combining optimization and synthesis design capabilities with analytical tools for interpreting spectrophotometric and ellipsometric data, modeling of film layers, and regression analysis for thickness and index determination. Sold as a licensed software product to thin film engineers and scientists.
• FilmTek 2000 DUV-NIR spectroscopic reflectometry automated metrology system for rapid, reliable characterization of unpatterned thin films with simultaneous determination of multiple film characteristics. Targets R&D and production thin film analysis.
• FilmTek SE Multi-angle spectroscopic ellipsometer with advanced rotating compensator design. Provides high measurement performance and speed for thin film applications at low cost, with 0.03Å repeatability on native oxide. Targets entry-level thin film metrology.
• FilmTek 2000M Micro-spot spectroscopic reflectometry benchtop system with measurement spot sizes as small as 2µm for patterned film applications. Targets thin film characterization on patterned wafers.
• FilmTek 2000 PAR Micro-spot DUV spectroscopic reflectometry system for high-throughput, fully-automated mapping of patterned wafers with 13µm spot size. Targets patterned wafer thin film mapping in production environments.
• FilmTek 2000 SE Benchtop metrology system combining spectroscopic ellipsometry (300nm-1700nm) and DUV multi-angle polarized reflectometry (240nm-1700nm). Targets thin to thick film applications in R&D and production.
• FilmTek 3000 DUV-NIR reflection and transmission spectrophotometer for efficient measurement of unpatterned films on transparent substrates, measuring thickness and optical constants of thin absorbing films. Targets solar, display, and optical coating industries.
• FilmTek 4000 Fully-automated wafer metrology system optimized for photonic integrated circuit manufacturing using multi-angle reflectometry with patented DPSD analysis, delivering 100x measurement performance advantage over non-contact methods. Targets photonic integrated circuit production.
• WaferScan Automated wafer geometry characterization system using chromatic confocal spectroscopy to measure stress-induced wafer shape changes, shape-induced overlay, wafer thickness variation, and front/back-side topography. Targets wafer manufacturing quality control.
• FilmTek 3000 PAR-SE Combined ellipsometry and micro-spot DUV-NIR reflection/transmission spectrophotometry with patented MADP and DPSD technology for advanced thin film measurement on transparent and non-transparent substrates.
• FilmTek 3000 PAR Micro-spot DUV reflection and transmission spectrophotometer with 50µm spot size for patterned films on transparent substrates.
• FilmTek 3000M Micro-spot reflection and transmission spectrophotometry with spot size down to 2µm for patterned films on transparent substrates with optional CD measurement.
• FilmTek 3000 SE Spectroscopic ellipsometry combined with DUV-NIR reflection/transmission spectrophotometry for thin absorbing films on transparent substrates with optional polarimetry for birefringence measurement.
• Measurement Services Sample measurement services performed at SCI's Carlsbad, CA facility using SCI's FilmTek metrology systems. A team of PhD-level scientists provides detailed analysis reports on customer samples including multi-layer film characterization of metallic, semiconductor, amorphous, crystalline, and dielectric materials. Targets customers needing characterization without purchasing equipment.

Quantifiable outcome

• 100x measurement accuracy advantage over best non-contact metrology method for photonic integrated circuits
• +7 more outcomes

Named customers2 records

Segments10 records

Ideal customer profiles6 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Feature6 records

Partnerships

Five partnerships are on record, tiered regional.

• Charntec Electronics LtdregionalChannel Partner/ Reseller/ DistributorCharntec Electronics Ltd is SCI's authorized distributor and support representative for the United Kingdom and broader European markets. Located in Eastleigh, UK, Charntec handles sales, customer support, and application support for SCI products across the region.
• Bruker Japan K.K. Nano-surface DivisionregionalChannel Partner/ Reseller/ DistributorBruker Japan K.K. Nano-surface Division serves as SCI's authorized distributor and support representative for Japan. Located in Tokyo, Bruker Japan provides sales, customer support, and application support for SCI products in the Japanese market, including dedicated customer and application support phone lines.
• Quatek Co., LtdregionalChannel Partner/ Reseller/ DistributorQuatek Co., Ltd is SCI's primary representative across Taiwan, China, Thailand, Malaysia, and broader Southeast Asia (Brunei, Cambodia, Indonesia, Laos, Myanmar, Vietnam). With offices in Taipei (headquarters), Hsinchu, Tainan, Kaohsiung (Taiwan), Shanghai (head office), Beijing, Shenzhen, Xi'an, Chengdu (China), Bangkok (Thailand), Penang (Malaysia), Quatek provides comprehensive sales and support coverage across Asia-Pacific.
• Caltron Pte LtdregionalChannel Partner/ Reseller/ DistributorCaltron Pte Ltd serves as SCI's authorized distributor for Singapore. Located in Singapore, Caltron handles sales and support for SCI products serving the Singapore market.
• mhonSONS Semicon EnterpriseregionalChannel Partner/ Reseller/ DistributormhonSONS Semicon Enterprise is SCI's authorized distributor for the Philippines. Located in Muntinlupa City, Philippines, mhonSONS handles sales and support for SCI products serving the Philippine semiconductor market.

Scale indicators3 records

Recent moves6 records

Expansion highlights5 records

Broad incumbents

• KLA Corporation: Largest semiconductor process control and yield management company, with broad portfolio spanning optical, e-beam, and X-ray metrology. Competes with SCI in OCD, thin film, and advanced packaging metrology, and is the dominant incumbent SCI must displace or partner with.
• Thermo Fisher Scientific: Diversified analytical instruments and laboratory equipment leader with thin-film and surface metrology offerings. Operates broadly in the same customer ecosystem as SCI, particularly in materials characterization and lab analytics.
• Bruker Corporation: Large scientific instruments company whose nano-surface division (which already distributes SCI in Japan) offers its own atomic force microscopy and optical profilometry products. Both adjacent and a distribution channel partner — a unique peer relationship.

Direct peers

• HORIBA Scientific: Division of HORIBA offering spectroscopic ellipsometry, Raman, and thin-film characterization tools. Directly competes with SCI in thin film and optical coating metrology markets.
• Filmetrics (KLA): Acquired by KLA, Filmetrics historically offered thin-film measurement reflectometers directly comparable to SCI's FilmTek 2000 series. Now part of KLA, it remains a competitive benchmark in the thin film reflectometry segment.
• Semilab: Supplier of thin-film and wafer metrology instruments for semiconductor, display, and PV manufacturing. Competes with SCI in ellipsometry, reflectometry, and wafer geometry characterization.
• Onto Innovation: Major optical CD and thin-film metrology vendor serving semiconductor and advanced packaging customers with OCD, film thickness, and 3D packaging solutions — directly competitive with SCI's FilmTek CD and FilmTek 2000M TSV.
• Rudolph Technologies (Onto Innovation): Now part of Onto Innovation, Rudolph provided optical metrology, macro defect inspection, and process control solutions for advanced packaging and front-end semiconductor — historically competing with SCI in thin film and CD metrology.
• SENTECH Instruments: German manufacturer of spectroscopic ellipsometers and plasma process diagnostics for semiconductor and photovoltaic applications. Competes with SCI's FilmTek SE and PAR-SE product lines in thin film measurement.
• J.A. Woollam Company: Specialized manufacturer of spectroscopic ellipsometers for thin film characterization. Direct competitor across the same ellipsometry and multi-angle measurement customer base in semiconductor, display, and photonics R&D and production.

Market position

Strengths4 records

Weaknesses5 records

Competitive moat4 records

Key risks1 record

Key highlights6 records

Customer concentration

• LinkedInlinkedin.com/company/scientific-computing-international

Revenue estimate

Valuation estimate

Number of profiles

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about Scientific Computing International