LayTec

What LayTec does

LayTec AG is a Berlin-based metrology company founded in 1994 (operational since 1999 per firmographic records) that develops and manufactures integrated in-situ, in-line, lab-line and map-line measurement instruments for advanced semiconductor and photovoltaic manufacturing processes. Its portfolio centers on the proprietary Connected Metrology® ecosystem, which links optical pyrometry, multi-wavelength reflectance, reflectance anisotropy spectroscopy, spectroscopic and time-resolved photoluminescence, and UV pyrometry into a wafer-ID-indexed SQL database accessible through the EpiNet software platform. Core instruments include EpiTT and EpiCurve TT (in-situ epitaxial monitoring), EpiRAS TT (cubic-semiconductor surface monitoring), Pyro 400 (UV pyrometry for GaN on transparent substrates), EpiX (ex-situ 2D wafer mapping), TRIton (plasma-etch endpoint detection), ILMetro (multi-head in-line thin-film systems), X Link (PV encapsulation cross-linking measurement), and PVScanner (AI-assisted handheld BOM verification). The company serves GaN/SiC power-electronics and RF device manufacturers, GaAs/InP photonic-device fabs, VCSEL producers, and thin-film PV (CIGS, perovskite, CdTe, OPV, a-Si) and crystalline-silicon PV manufacturers worldwide.

The business model combines capital-equipment hardware sales (instruments typically priced at six-figure order values), recurring EpiNet software licenses in tiered basic/premium/custom configurations, and ongoing service revenue covering installation, warranty, training, preventive maintenance, and calibration. Go-to-market is hybrid: direct enterprise sales from Berlin headquarters complemented by an extensive regional channel of technically-staffed representatives in China, Taiwan, Korea, Japan, India, Malaysia, Singapore, Vietnam, Indonesia, Thailand, the Philippines, and North America. LayTec operates as a subsidiary of the diversified German technology group Nynomic, has 51–100 employees drawn from 25 nationalities, and monetizes both R&D-grade single instruments and high-volume in-line production systems.

Name

LayTec

Legal name

LayTec AG

Website

https://laytec.de

Company type

Private

Founded year

1994

Operating status

Operating

Headcount range

51–100 employees

Short description

LayTec AG is a Berlin-based metrology company that designs integrated in-situ and in-line optical measurement systems for compound-semiconductor (GaN, SiC, GaAs, InP) and photovoltaic manufacturers, selling hardware, software, and services globally.

Ownership category

akta.pro rank

Product category

Semiconductor Metrology

NAICS

Semiconductor Machinery Manufacturing (333242), Analytical Laboratory Instrument Manufacturing (334516)

SIC

Laboratory Analytical Instruments (3826), Industrial Instruments For Measurement, Display, And Control (3823)

akta.pro primary industry

Deposition Equipment (CVD/PVD/ALD/Epitaxy) (HDAHAEAB)

akta.pro secondary industries

Compound Semiconductor Wafers & Substrates (SiC/GaN/GaAs/InP/Sapphire) (HDAHAGAB), Epitaxy Materials & Services (Epi Wafers/MBE/MOCVD) (HDAHAGAC)

Keywords

• In-situ metrology
• Semiconductor process control
• Thin-film measurement
• Epitaxial growth monitoring
• Photovoltaic inspection

Headquarters

HQ city

Berlin

HQ country

Germany

HQ region

Europe

Offices1 record

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Personnel, Supply Chain, Operations, Marketing or Sales, Infrastructure

Revenue model

1. Metrology Hardware Systems: Sale of integrated metrology instruments including EpiTT, EpiCurve TT, EpiRAS TT, Pyro 400, EpiX mapping stations, TRIton, and other optical measurement systems for semiconductor manufacturing
2. Software Licenses and Support: EpiNet software for metrology data analysis and process control, including basic, premium, and customized license options
3. ILMetro In-line Systems: Customized multi-head optical metrology stations combining multiple LayTec systems for thin-film solar cell and display production lines
4. Service and Support: Initial installations, warranty services, training sessions, preventive maintenance visits, calibration services, and ongoing technical support

Go-to-market motion1 record

Distribution channels1 record

Marketing channels7 records

Core offering

LayTec develops and manufactures integrated metrology solutions covering in-situ, in-line, lab-line and map-line measurements for compound semiconductor and photovoltaic manufacturing processes. The portfolio includes optical pyrometers, reflectance and photoluminescence monitors, wafer mapping stations, plasma etch endpoint detectors, and the EpiNet® software platform, organized around the Connected Metrology® ecosystem that links wafer-level data across process steps. Products target epitaxial growth control (GaN, GaAs, InP, SiC), thin-film solar cell production, and advanced device manufacturing.

Product overview

LayTec develops and manufactures integrated metrology solutions for advanced semiconductor and photovoltaic manufacturing processes. The product portfolio consists of in-situ, in-line, lab-line and map-line metrology tools organized around the Connected Metrology ecosystem. Core products include: EpiTT and EpiCurve TT for in-situ epitaxial monitoring; EpiRAS TT for cubic semiconductor surface analysis; Pyro 400 for UV pyrometry; TRIton for plasma etch endpoint detection; and the InspiRe and Flames systems for spectral monitoring. The EpiX platform provides 2D optical wafer mapping for ex-situ characterization. For photovoltaic applications, PearL/t-PearL offer photoluminescence analysis, X Link systems measure cross-linking in module encapsulation, and PVScanner enables handheld BOM verification. All products integrate with the proprietary EpiNet Software platform for data analysis and process control, with data unified in a LayTec SQL database enabling wafer-level traceability across process steps.

Differentiator

Problem solved

Functional benefit

Brands

• EpiNet®: Software for control, analysis and optimization of epitaxial processes in production and development of LEDs, laser diodes, VCSEL, HEMT, HBT and other electronic and optoelectronic devices.
• TRIton®
• Pyro 400
• EpiCurve® TT
• EpiRAS® TT
• EpiTT
• EpiX®
• PearL and t-PearL
• Flames
• Connected Metrology®
• X Link®
• PVScanner
• ILMetro
• AbsoluT
• InspiRe
• Etchpoint

Products and services

• EpiTT In-situ monitor combining temperature and reflectance measurements at three wavelengths for epitaxial growth control in semiconductor deposition processes.
• EpiCurve TT Combines wafer curvature measurements with emissivity-corrected pyrometry and growth rate/thickness measurements by three-wavelength reflectance for comprehensive epitaxial process monitoring.
• EpiRAS TT Multipurpose in-situ monitor for epitaxial growth of cubic semiconductors, monitoring properties of surfaces, interfaces and doping-induced surface electric fields through reflectance anisotropy spectroscopy.
• Pyro 400 Dedicated UV pyrometer for GaN-based epitaxy on transparent substrates as well as on silicon, measuring surface temperature with high precision for IR-transparent materials.
• EpiX Modular wafer mapping station for ex-situ optical characterization of compound semiconductor and related wafers. Combines XY mapping stage with UV-VIS-NIR spectroscopic reflectance and photoluminescence metrology for dense 2D maps of thickness, composition and luminescence parameters across full wafers.
• AbsoluT Provides precise simulated temperature for on-site temperature calibration of LayTec's EpiTT and EpiCurve TT systems.
• NEPtune In-situ monitoring tool for semiconductor process control referenced in the LayTec product portfolio.
• InspiRe Spectral in-situ monitoring tool for various compound semiconductors such as perovskites and CIGS, using spectroscopic reflectance and transmittance measurements.
• TRIton Automated endpoint detection for plasma etching with multi-wavelength in-situ reflectometry, part of the Connected Metrology ecosystem.
• ILMetro In-line metrology station combining up to five LayTec in-line metrology systems for comprehensive control of industrial thin-film production processes through non-contact measurements.
• X Link in-line Fast, automated, non-destructive system for in-line evaluation of EVA or polyolefin cross-linking level immediately after lamination in solar module production, with 100% coverage capability.
• X Link off-line Stand-alone version of the cross-linking measurement system designed for lab applications, manual product sampling, areal mappings, R&D labs and pilot lines.
• PearL Spectroscopic photoluminescence (sPL) system for characterizing band gap, electronic defects and composition of semiconductor materials with 100ms total measurement and analysis time.
• t-PearL Time-resolved photoluminescence (trPL) system for direct charge carrier lifetime measurements, analyzing decay of photoluminescent radiation after laser excitation.
• Flames Multi-head optical metrology system for in-line monitoring of multi-layer thin-film structures in large area coating processes, measuring reflectance, transmittance and layer thickness with up to seven traces.
• EpiNet Software Proprietary software for control, analysis and optimization of epitaxial processes in production and development of LEDs, laser diodes, VCSEL, HEMT, HBT and other electronic and optoelectronic devices. Includes advanced algorithms, GOLDEN RUN analysis, and fab integration capabilities.
• Etchpoint Fully integrated end point detection (EPD) solution for Oxford Instruments Plasma Technologies' PlasmaPro 100 Atomic Layer Etch system, using UV reflectance-based endpoint detection for GaN power electronics and RF applications.
• PVScanner Handheld NIR optical sensor device for verification of bill of materials (BOM) for PV modules, identifying backsheet type and EVA through spectral reflectance measurements with AI-driven analysis.

Quantifiable outcome

• Real GaN surface temperature can deviate from pocket temperature by up to 20 K or more during bowed wafer processing
• +3 more outcomes

Named customers1 record

Segments10 records

Ideal customer profiles2 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Integration3 records

AI capability2 records

Feature11 records

Partnerships

Twelve partnerships are on record, tiered core, regional and minor.

• CaeluxcoreStrategic or Co-development Partner · 5 March 2025Caelux selected LayTec to ensure unprecedented quality of perovskite-based solar glass. This partnership involves using LayTec's metrology solutions for quality control in perovskite solar cell manufacturing.
• ICMOVPE XXII ConferencecoreStrategic or Co-development PartnerLayTec's 32nd in-situ seminar will be held in conjunction with the ICMOVPE XXII conference in Korea at the Jeju International Convention Center in July 2026.
• Oxford InstrumentscoreTechnology or IntegrationLayTec developed Etchpoint as a fully integrated End Point Detection (EPD) solution for Oxford Instruments Plasma Technologies' proprietary PlasmaPro 100 Atomic Layer Etch for GaN power electronics & RF applications. Features unrivalled post-etch remaining AlGaN thickness accuracy of ±0.5 nm.
• Bergen Associates Pvt. Ltd.regionalChannel Partner/ Reseller/ DistributorRegional sales representative for photovoltaic applications in India, located in New Delhi.
• Challentech International Shanghai Corp.regionalChannel Partner/ Reseller/ DistributorRegional sales and service representative for compound semiconductor applications in China (Shanghai), covering sales contact Jason Chou and service contact David Zhang.
• Challentech International Corp.regionalChannel Partner/ Reseller/ DistributorRegional sales and service representative for compound semiconductor applications in Taiwan (Hsinchu County), covering sales contact Pearline Wu and service contact Jerry Hsieh.
• Ecotech Corp.regionalChannel Partner/ Reseller/ DistributorRegional sales and service representative for compound semiconductor and photovoltaic applications in Korea (Seongnam-si, Gyeonggi-do), covering sales contact Paul Kim and service contact Bohyeok Chung.
• Ceramic Forum Co., Ltd.regionalChannel Partner/ Reseller/ DistributorRegional representative for compound semiconductor applications in Japan (Tokyo), with contact Robin Schulz.
• Shanghai DAYK M&E Equipment Co., LtdregionalChannel Partner/ Reseller/ DistributorRegional sales and service representative for photovoltaic applications in China (Shanghai), with contact Justin Zheng.
• QES (Asia-Pacific) Sdn BhdregionalChannel Partner/ Reseller/ DistributorRegional sales and service representative for compound semiconductor and photovoltaic applications covering Malaysia, Singapore, Vietnam, Indonesia, Thailand and Philippines, with contact SC Pang.
• Ferdinand-Braun-InstitutminorStrategic or Co-development PartnerFrank Brunner from Ferdinand-Braun-Institut presenting on 'In-situ metrology during homoepitaxial growth of GaN - what is possible and what is not' at LayTec's 32nd in-situ seminar.
• Meijo UniversityminorStrategic or Co-development PartnerTetsuya Takeuchi from Meijo University presenting on 'In-situ measurements and control towards high-efficiency GaN-based VCSELs' at LayTec's 32nd in-situ seminar.

Scale indicators1 record

Recent moves6 records

Expansion highlights5 records

Direct peers

• SENTECH Instruments: Berlin-based manufacturer of plasma-process and thin-film metrology equipment including spectroscopic ellipsometers and reflectometers. Closest German-headquartered direct competitor to LayTec in thin-film and plasma-etch metrology.
• J.A. Woollam: US-based specialist in spectroscopic ellipsometry for thin-film characterization, widely used in compound semiconductor, PV, and display R&D and production. Directly comparable optical thin-film measurement technology to LayTec's reflectance- and PL-based tools.
• Onto Innovation: Provides optical critical dimension metrology, thin-film measurement, and macro defect inspection for advanced packaging, compound semi, and specialty devices. Direct competitor in thin-film/reflectance-based metrology for compound semiconductor and PV customers.
• Nova Measuring Instruments: Specializes in optical and X-ray metrology for process control across advanced logic, memory, and specialty/compound semiconductor fabs. Comparable to LayTec as a process-control instrumentation peer serving high-end semiconductor manufacturers.
• Semilab: Hungary-headquartered supplier of non-contact electrical and optical metrology for semiconductor, PV, and display manufacturing. Comparable to LayTec in offering thin-film and in-line metrology across compound semi and PV fabs.

Broad incumbents

• KLA Corporation: Largest semiconductor process-control and yield-management company, with broad portfolio in wafer inspection, thin-film metrology (Filmetrics), and review. Overlaps with LayTec in thin-film/thickness metrology for compound semi and PV, but addresses a much broader node and material set.
• Lasertec: Japanese specialist in photomask and wafer inspection equipment, with growing exposure to compound-semiconductor and SiC power-device inspection. Adjacent peer given shared process-control instrumentation orientation in advanced semiconductor manufacturing.
• Bruker: Diversified scientific instrumentation company with X-ray, AFM, and optical metrology lines serving semiconductor and PV manufacturers. Comparable in the analytical instrument category though broader and more diversified than LayTec's compound-semi focus.
• Hitachi High-Tech: Japanese supplier of semiconductor metrology, inspection, and CD-SEM equipment serving fabs globally. Overlaps with LayTec in thin-film and process-control instrumentation for compound-semi and PV manufacturers.
• Oxford Instruments: UK-based supplier of etch and deposition process tools, including the PlasmaPro 100 ALD system for which LayTec co-developed Etchpoint. Both partner and adjacent peer given overlapping customer base in GaN power and RF, plus competing metrology instrumentation in adjacent product lines.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat6 records

Key risks6 records

Key highlights7 records

Customer concentration

• YouTubeyoutube.com/@TheLaytec
• LinkedInlinkedin.com/company/laytec

Revenue estimate

Valuation estimate

Number of profiles

Profiles3 records

Funding overview

Funding rounds

Investors

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about LayTec