What NenoVision does

NenoVision s.r.o. is a privately held deep-technology company founded in 2014 and headquartered in Brno, Czech Republic, where over 30% of the world's electron microscopes are manufactured. The company is the first spin-off from Brno University of Technology and the Central European Institute of Technology (CEITEC). NenoVision develops, manufactures, and sells LiteScope, an atomic force microscope (AFM) engineered for fast and easy integration into scanning electron microscopes (SEMs), enabling in-situ correlative and multimodal analysis of microscopic samples. The product is differentiated by proprietary CPEM (Correlative Probe & Electron Microscopy) technology, which allows simultaneous acquisition and real-time correlation of AFM and SEM data without sample transfer between instruments. The platform comprises the LiteScope scan head, the NenoBox open-hardware control unit (developed with the Czech Metrology Institute), the NenoView web-based control software, an ecosystem of self-sensing AFM probes (NenoProbe Conductive, Pt-Sharp, Akiyama, Magnetic, piezo-resistive), and a modular add-on suite including Sample Rotation, Load-Lock, Sample Transfer, Nanoindentation (with Alemnis), UHV, and ESEM adaptations.

The company commercializes through a global distributor network covering 39 countries across 23 European, 8 Asia-Pacific, and 4 Americas markets, alongside direct sales for the Czech Republic and Slovakia. Revenue mechanics are anchored in capital-equipment sales of the LiteScope system (quote-based, multi-year contract pricing), recurring probe and consumables revenue, and professional services including installation, training, and technical consultation. Customer segments span semiconductor failure analysis (BASF, NVIDIA, Onsemi, Arizona State University), battery and energy materials research (Brno University of Technology, BASF for solid-state batteries), materials science (TU Munich, ETH Zurich, CEITEC Nano, KIST Jeonbuk), and life sciences. Six certified reference laboratories worldwide, including Arizona State University and KIST Jeonbuk, support customer demonstrations and joint research partnerships. The company has received multiple EU and Czech Republic R&D grants (IM BEAST, CAEPO, TACOM, INCHAR, GEFSEM, POMITE) as well as early-stage investment from JIC Ventures and Y Soft Ventures (2017, 2019). Notable recognitions include the R&D 100 Award in 2024 and the Czech Head 2025 Award.

Name

NenoVision

Legal name

NenoVision s.r.o.

Website

https://nenovision.com

Company type

Private

Founded year

2014

Operating status

Operating

Headcount range

11–50 employees

Short description

NenoVision is a Brno, Czech Republic-based deep-tech company that develops and sells LiteScope, a proprietary AFM-in-SEM instrument using CPEM technology for simultaneous correlative microscopy, serving semiconductor, battery, materials science, and life science researchers through a 39-country distributor network.

Ownership category

akta.pro rank

Product category

Scientific Instrumentation

NAICS

Navigational, Measuring, Electromedical, and Control Instruments Manufacturing (33451)

SIC

Laboratory Analytical Instruments (3826), Industrial Instruments For Measurement, Display, And Control (3823)

akta.pro primary industry

Microscopy, Imaging & Flow Cytometry Instruments (HLAGAIAE)

akta.pro secondary industry

Metrology, Inspection & Machine Tool Accessories (CMMs, Probing, Gauging) (IMAHADAK)

Keywords

• AFM-in-SEM microscopy
• Correlative microscopy instruments
• Scientific instrumentation
• Scanning probe microscopy
• Nanoscale imaging equipment

Headquarters

HQ city

Brno

HQ country

Czechia

HQ region

Europe

Offices1 record

Markets served

GTM type

B2B

Offering type

Hardware or Manufacturing

Cost components

Technology or R&D, Supply Chain, Personnel, Marketing or Sales, Operations

Revenue model

1. LiteScope AFM-in-SEM System Sales: Sale of complete AFM-in-SEM instrument including scan head, NenoBox control unit, NenoView software, SEM adaptation plate, vacuum feedthrough, and cabling. Main revenue stream from hardware sales of scientific instrumentation.
2. Probes and Consumables: Sale of various self-sensing probes including NenoProbe Conductive, Pt-Sharp, Akiyama, NenoProbe Magnetic, and piezo-resistive probes for different measurement modes.
3. Modules and Accessories: Sale of optional modules including sample rotation module, load-lock mechanism, sample transfer module, nanoindentation module (with Alemnis), and accessories such as NenoCase with digital camera and stubs.
4. Customized Solutions: Custom adaptations of LiteScope for specific environments including UHV (Ultra-High Vacuum) adaptation, ESEM (Environmental SEM) adaptation, and other specialized configurations for unique research requirements.
5. Professional Services and Support: Technical support, installation, training, and consultation services associated with LiteScope products.

Pricing tiers

Go-to-market motion1 record

Distribution channels5 records

Marketing channels6 records

Core offering

NenoVision develops, manufactures, and sells LiteScope, an atomic force microscope module that integrates inside existing scanning electron microscopes to perform simultaneous AFM and SEM measurements via its proprietary CPEM technology. The offering is sold as a complete system (scan head, NenoBox control unit, NenoView software, SEM adaptation plate, vacuum feedthrough, cabling) along with self-sensing probes, modular accessories, customized UHV/ESEM/nanoindentation adaptations, and related professional services.

Product overview

NenoVision is a technology company that develops, manufactures, and sells the LiteScope AFM-in-SEM, a revolutionary atomic force microscope designed for integration into scanning electron microscopes. The core product portfolio centers on LiteScope, which combines AFM and SEM capabilities through proprietary CPEM (Correlative Probe and Electron Microscopy) technology. The ecosystem includes the NenoBox control unit and NenoView software as core components, various self-sensing probes (NenoProbe Conductive, Pt-Sharp, Akiyama, NenoProbe Magnetic, Piezo-resistive, Trilayer Cantilever), modules and accessories (Sample Rotation, Load-Lock, Sample Transfer, NenoCase), and customized solutions (UHV adaptation, ESEM adaptation, Nanoindentation Module). This modular architecture allows customers to configure LiteScope for specific applications across semiconductor failure analysis, battery materials research, material science, and life sciences.

Differentiator

Problem solved

Functional benefit

Brands

• LiteScope: AFM-in-SEM (Atomic Force Microscope integrated into Scanning Electron Microscope) - the company's primary product for correlative and multimodal in-situ analysis of microscopic samples.
• LiteScope 2.5
• NenoBox
• NenoView
• CPEM
• NenoCase
• NenoProbe

Products and services

• LiteScope AFM-in-SEM Atomic force microscope module designed for fast and easy integration into scanning electron microscopes, enabling simultaneous AFM and SEM measurements through proprietary CPEM technology for in-situ multimodal analysis of microscopic samples. Sold as a complete system with scan head, control unit, software, SEM adaptation plate, vacuum feedthrough, and cabling.
• NenoVision Self-Sensing Probes (NenoProbe Conductive, Pt-Sharp, Akiyama, NenoProbe Magnetic, piezo-resistive, Trilayer Cantilever) Self-produced AFM probes without optical detection or laser adjustment, supporting conductive-AFM, KPFM, PFM, I-V spectroscopy, MFM, topography, and energy dissipation measurements. Consumable line used with the LiteScope AFM-in-SEM system.
• Sample Rotation Module Enables mounting several samples into the SEM chamber simultaneously and performing correlative AFM and SEM measurements (and FIB milling procedures) without opening the chamber.
• Load-Lock Mechanism Provides quick and easy sample and/or AFM probe exchange without disrupting high vacuum in the SEM chamber through standard SEM air-lock/load-lock sample transfer system.
• Sample Transfer Module Enables efficient, controlled-environment analysis of air-sensitive samples (e.g., solid-state battery materials) via standard SEM air-lock/load-lock systems, with flexible operation for manipulation through SEM transfer systems or manual insertion.
• NenoCase Storage and operating case that allows LiteScope to perform as a stand-alone device outside the SEM chamber, with passive anti-vibration system and optional gas purge capability.
• UHV Adaptation of LiteScope Ultra-high vacuum adaptation of LiteScope for integration into UHV scanning electron microscopes, suitable for surface science, nanotechnology, and semiconductor research requiring the cleanest measurement conditions.
• ESEM Adaptation of LiteScope Environmental SEM and low-vacuum mode adaptation of LiteScope for imaging non-conductive, uncoated, or hydrated samples without conductive coatings — particularly beneficial for life sciences, polymers, and soft matter research.
• Nanoindentation Module Module co-developed with Alemnis enabling quantitative measurement of mechanical properties — including local hardness and elasticity — inside the SEM, switchable between standard LiteScope operation and the nanoindenter + AFM-in-SEM combination.

Quantifiable outcome

• Mounting and dismounting takes minutes
• +2 more outcomes

Named customers13 records

Segments5 records

Ideal customer profiles5 records

Technology focussed Yes

API detail

Has API

No

API docs

API detail

Core technology

AI maturity

App detail

Integration8 records

AI capability4 records

Feature7 records

Partnerships

20 partnerships are on record, tiered core and minor.

• JP Kummer Semiconductor Technology GmbHcoreChannel Partner/ Reseller/ DistributorExclusive distributor for Germany, Austria, and German-speaking Switzerland. Provides sales, technical support, and customer consultation for LiteScope AFM-in-SEM products in these markets.
• Benelux Scientific bvbacoreChannel Partner/ Reseller/ DistributorDistributor covering Belgium, Netherlands, and Luxembourg. Offers sales support and technical consultation for LiteScope products in the Benelux region.
• Toyo Corporation (Japan)coreChannel Partner/ Reseller/ DistributorExclusive distributor for Japan, providing local sales, technical support, and customer service for LiteScope AFM-in-SEM products.
• Angstrom Scientific, Inc.coreChannel Partner/ Reseller/ DistributorDistributor for USA and Canada, providing sales, installation, and technical support services for LiteScope products in North America.
• AXT Pty LtdcoreChannel Partner/ Reseller/ DistributorDistributor for Australia and New Zealand, providing sales and technical support for LiteScope products.
• EDEN Instruments SAScoreChannel Partner/ Reseller/ DistributorDistributor for France and French-speaking Switzerland, offering sales and technical support for LiteScope products.
• Assing S.p.A.coreChannel Partner/ Reseller/ DistributorDistributor for Italy, providing sales and technical consultation for LiteScope AFM-in-SEM products.
• Spectral ABcoreChannel Partner/ Reseller/ DistributorDistributor for Denmark, Norway, and Sweden, providing sales and technical support for LiteScope products in Scandinavia.
• Phenom Scientific Instruments (Shanghai) Co., Ltd.coreChannel Partner/ Reseller/ DistributorDistributor for China, providing sales and technical support for LiteScope products in the Chinese market.
• AlemniscoreStrategic or Co-development PartnerCo-development partnership for Nanoindentation Module for LiteScope. Alemnis developed the nanoindentation system that integrates with LiteScope to enable quantitative mechanical properties measurement inside SEM.
• Czech Metrology InstitutecoreStrategic or Co-development PartnerPartnership for NenoBox development based on Czech Metrology Institute's GwyScope DSP controller. Provides full development support for scientific users.
• Arizona State UniversitycoreStrategic or Co-development PartnerJoint research and development partnership. Arizona State University Nanoelectronics Metrology & Failure Analysis Lab works with NenoVision on semiconductor failure analysis applications. Umberto Celano's group is a reference laboratory for LiteScope.
• NVIDIAcoreStrategic or Co-development PartnerJoint study presented at ISTFA 2025 integrating in-situ conductive AFM (CAFM) with plasma FIB in single SEM platform for semiconductor failure analysis.
• Brno University of TechnologycoreStrategic or Co-development PartnerFounding academic institution and spin-off origin. NenoVision was the first spin-off from Brno University of Technology and CEITEC. Ongoing research collaboration on battery materials and other applications.
• CEITEC (Central European Institute of Technology)coreStrategic or Co-development PartnerFounding research institution and spin-off origin. NenoVision was the first spin-off from CEITEC. CEITEC Nano serves as a reference laboratory. Ongoing collaborative research on nanomaterials and semiconductor characterization.
• KIST (Korea Institute of Science and Technology)coreStrategic or Co-development PartnerResearch partnership on advanced materials. KIST Jeonbuk serves as a reference laboratory for LiteScope in Korea. Collaborative research on functional composite materials.
• Institute of Physics of the Czech Academy of SciencescoreStrategic or Co-development PartnerResearch partner for correlative microscopy development. Joint work on secondary phases in advanced high strength steels and multiphase steel structures.
• Orsay PhysicsminorStrategic or Co-development PartnerResearch partner in the field of electron microscopy and nanoanalysis technologies.
• BASFcoreStrategic or Co-development PartnerCollaboration on solid-state battery (SSB) cathode analysis using LiteScope. BASF SE Lab Team uses LiteScope for conductivity measurements and quality evaluation of SSB electrodes.
• deepXscan GmbHminorStrategic or Co-development PartnerCollaboration on 3D nano-sized sample characterization using CPEM technology for unique information about samples deposited on cm-sized substrates.

Scale indicators5 records

Recent moves6 records

Expansion highlights6 records

Direct peers

• Park Systems: Park Systems is a leading research and industrial AFM vendor with strong penetration in semiconductor and materials science labs globally. Its NX-series AFMs compete for the same nanoscale electrical and surface characterization budgets that LiteScope targets.
• NT-MDT Spectrum Instruments: NT-MDT is a global AFM and SPM manufacturer serving academic and industrial research markets. Its modular AFM platforms compete in similar materials science, life science, and semiconductor research use cases that drive LiteScope demand.
• Oxford Instruments (Asylum Research, Cypher ES): Oxford Instruments owns Asylum Research, one of NenoVision's most direct head-to-head competitors in research-grade AFM. Its Cypher ES platform is positioned for integrated/correlative workflows in semiconductor and battery research, putting it on the same buying shortlists as LiteScope.

Broad incumbents

• Carl Zeiss Microscopy: Zeiss is one of the major SEM manufacturers with which LiteScope is explicitly compatible, and a leading supplier of multimodal/correlative microscopy workflows in materials and life sciences. Its Crossbeam FIB-SEM and correlative software suites overlap with NenoVision's positioning and customer base.
• Keysight Technologies (Nano Indenter, AFM): Keysight provides nanoscale measurement and test solutions including AFM and nanoindentation products to semiconductor and research customers. It is a particularly close adjacent competitor because it competes both for AFM dollars and for mechanical-properties/nanoindentation workflows that NenoVision addresses through its Alemnis partnership.
• JEOL: JEOL is a major SEM and electron-optics manufacturer and one of NenoVision's explicit integration partners. JEOL's installed base of electron microscopes in research and semiconductor labs represents both an install base for LiteScope and a competitive risk if JEOL bundled its own AFM solution.
• Thermo Fisher Scientific (Microscopy): Thermo Fisher is a dominant scanning/transmission electron microscope vendor and a broader analytical instruments supplier. Its SEM fleet and DualBeam tools are explicitly supported by LiteScope, and the company could conceivably integrate or acquire AFM-in-SEM capability.
• Hitachi High-Tech (Science Systems): Hitachi High-Tech's electron microscopy business supplies high-end SEMs and analytical instruments. Its SEMs are among the platforms LiteScope integrates with, and its portfolio (including ex-Thermo Fisher Ex-Metro branded SEMs) creates a major cross-sell channel for NenoVision.
• Bruker Nano Surfaces (Dimension Icon, Innova): Bruker is the largest pure-play AFM and nanoscale metrology vendor. Its Dimension/Icon and Innova AFM platforms serve the same semiconductor failure-analysis, materials science, and life-science research customers as NenoVision, and it has the resources to develop or acquire AFM-in-SEM capability if the category proves strategic.
• TESCAN (Orsay Physics): TESCAN and its Orsay Physics subsidiary supply SEM and FIB-SEM instruments and accessories globally and are explicitly supported by LiteScope. The partnership brings NenoVision onto TESCAN's customer purchase process and into its installed base, while TESCAN remains a potential adjacent competitor or acquirer.

Market position

Strengths5 records

Weaknesses5 records

Competitive moat5 records

Key risks5 records

Key highlights7 records

Customer concentration

• Xx.com/NenoVision
• YouTubeyoutube.com/channel/UClhHvBAiZ5O4SqUWLUoQt7g
• Facebookfacebook.com/nenovision
• LinkedInlinkedin.com/company/nenovision

Revenue estimate

Valuation estimate

Number of profiles

Profiles5 records

Funding overview

Funding rounds2 records

Investors2 records

Funding detail is available on the Subscription and Enterprise plan.Contact sales →

M&A

Investments

M&A and investment is available on the Subscription and Enterprise plan.Contact sales →

Frequently asked questions about NenoVision